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Conferences

HF RFID Electromagnetic Emissions and Performance

November 4, 2008

Author(s)

David R. Novotny, Jeffrey R. Guerrieri, Michael H. Francis, Catherine A. Remley

We examined the emissions, and susceptibility of commercial High-Frequency Radio Frequency Identification (HF proximity RFID) systems to interrupt and

Calibration of a Computer Assisted Orthopedic Hip Surgery Phantom

November 4, 2008

Author(s)

Daniel S. Sawyer, Nicholas G. Dagalakis, Craig M. Shakarji, Yong Sik Kim

Orthopedic surgeons have identified a need for calibration artifacts (phantoms) to establish the traceability (to the SI unit of length) of measurements

Thermal Decomposition of RP-1, RP-2, and Mixtures of RP-2 With Stabilizing Additives

November 3, 2008

Author(s)

Jason A. Widegren, Thomas J. Bruno

----- FOR POLICY REVIEW ONLY ----- The thermal decomposition of RP-1, RP-2, and mixtures of RP-2 with three different additives has been investigated. The

Training of neural networks to perform optical performance monitoring of a combination of accumulated signal nonlinearity, CD, PMD, and OSNR

November 1, 2008

Author(s)

Jeffrey A. Jargon, Xiaoxia Wu, Louis Christen, Alan Willner

We propose a technique using artificial neural networks to simultaneously identify fiber nonlinearity, OSNR, CD, and PMD from eye-diagram and eye-histogram

Monitoring I/Q data and pulse carving misalignments in RZ-DQPSK transmitters using a neural network approach

November 1, 2008

Author(s)

Jeffrey A. Jargon, Xiaoxia Wu, Louis Christen, Alan Willner, Loukas Paraschis

We propose a technique using artificial neural networks (ANNs) to simultaneously identify I/Q data misalignment and data/carver misalignment in both parallel

Local Geometric Projection-Based Noise Reduction for Vibration Signal Analysis in Rolling Bearings

October 31, 2008

Author(s)

Kang B. Lee, Steven E. Fick, Robert Gao, Ruqiang Yan

This paper presents a noise reduction technique for vibration signal analysis in rolling bearings, based on local geometric projection (LGP). LGP is a non

NIST BusiBEES METRICS AND TOOLS FOR GREEN BUILDINGS

October 31, 2008

Author(s)

Barbara C. Lippiatt, Jennifer Helgeson

Building stakeholders need compelling metrics, tools, data, and case studies supporting major investments in sustainable building technologies. Proponents of

UV pulse response nonlinearity of two Si photodiodes

October 30, 2008

Author(s)

Shao Yang, Darryl A. Keenan, Marla L. Dowell

We measured the pulse response nonlinearity of two silicon photodiodes at 193 and 248 nm with different measurement conditions. We found large and different

Vulnerability Scoring for Security Configuration Settings

October 29, 2008

Author(s)

Karen A. Scarfone, Peter M. Mell

The best-known vulnerability scoring standard, the Common Vulnerability Scoring System (CVSS), is designed to quantify the severity of security-related software

MOLECULAR RELAXATIONS AND MORPHOLOGY OF PERFLUOROSULFONATE IONOMERS FOR FUEL CELL APPLICATIONS

October 28, 2008

Author(s)

Kirt A. Page, Alamgir Karim

Perfluorosulfonate ionomers (PFSIs) are of great importance in polymer electrolyte membrane fuel cell (PEMFC) applications. In order to optimize membrane

Broadband Dielectric Material Characterization: A Comparison of On-Wafer and Split-Cylinder Resonator Measurements

October 27, 2008

Author(s)

Michael D. Janezic, Uwe Arz

We examine a broadband method to extract the relative permittivity and loss tangent of low-loss dielectric substrates from on-wafer scattering-parameter

A microfabricated photonic magnetometer

October 26, 2008

Author(s)

Jan Preusser, Vladislav Gerginov, Svenja A. Knappe, John E. Kitching

An integrated optically-controlled sensor, suitable for remote, high-sensitivity detection of magnetic fields is presented. The sensor head is free of

Characterization and Modeling of Random Vector Network Analyzer Measurement Errors

October 24, 2008

Author(s)

Arkadiusz C. Lewandowski, Dylan F. Williams

We present a technique for characterizing and modeling random vector-network-analyzer measurement errors. These errors manifest themselves as random changes or

Establishment of the SIM Time Scale

October 22, 2008

Author(s)

Michael A. Lombardi, Nelida Diaz-Munoz, J. Mauricio Lopez-Romero

The SIM time and frequency metrology working group has developed a comparison network for the Americas, with the goals of improving metrology in the SIM region

Unexpectedly high encapsulation efficiency in nanometer scale liposomes with hydrodynamic focusing using continuous-flow microfluidcs

October 20, 2008

Author(s)

Andreas Jahn

A method is presented for achieving high entrapment efficiencies of a hydrophilic drug simulant, sulforhodamine B (SRB), in nanometer-scale liposomes using a

Radius Measurement of Spherical Surfaces With Large Radii-of-Curvature Using Dual-Focus Zone Plates

October 20, 2008

Author(s)

Quandou (. Wang, Guangjun Gao, Ulf Griesmann

The measurement of spherical surface radii exceeding a few meters presents a challenge, because the familiar radius-bench method requires large part

Technical Aspects of the Dissemination of the Air-Kerma Standard from Cs137 Gamma-Ray Beams in the United States

October 20, 2008

Author(s)

Ronaldo Minniti

The national standard for air kerma from gamma-ray beams is maintained in the US by the National Institute of Standards and Technology (NIST), the primary

Error Motions of a Non-orthogonal Rotary Axis

October 19, 2008

Author(s)

Michael L. McGlauflin, Shawn P. Moylan

Error-motions of rotating axes are one of many sources of imprecision in machining. Accurate determination of axis of rotation error motions of the rotary axes

A Platform for Observing the Behavior of AFM Cantilevers During Quasi-Static Loading

October 19, 2008

Author(s)

Jon R. Pratt, Lee M. Kumanchik, Tony L. Schmitz

This paper describes a platform for studying the bending behavior of ultra-compliant (stiffness less than 1 N/m) atomic force microscope (AFM) cantilevers. The

OPTIMIZING GAUSSIAN FILTER LONG WAVELENGTH CUTOFF »c FOR IMPROVING 3D BALLISTICS SIGNATURE CORRELATIONS

October 19, 2008

Author(s)

Jun-Feng Song, Li Ma, Theodore V. Vorburger, Susan M. Ballou

In the ballistics measurements and correlations, optimum selection of c has particular importance for an unambiguous extraction of Individual Characteristics

Comparison of NIST SI Force Scale to NPL SI Mass Scale

October 19, 2008

Author(s)

Christopher W. Jones, John A. Kramar, Stuart Davidson, Richard Leach, Jon R. Pratt

Small masses in the 1.0 mg to 0.1 mg range were developed and calibrated at NPL with traceability to the IPK. These masses were transported to NIST at

A COMPACT, COMPOUND ACTUATOR FOR THE MOLECULAR MEASURING MACHINE

October 19, 2008

Author(s)

Jing Li, Yin-Lin Shen, Jaehwa Jeong, Fredric Scire, John A. Kramar

A compact, two-stage, vertical actuator with built-in sensors has been developed for the Molecular Measuring Machine (M3) and other potential precision

High Performance Organic Thin-Film Transistors Made Simple Through Molecular Design and Processing

October 17, 2008

Author(s)

Oana Jurchescu, Marina Feric, Behrang H. Hamadani, M. Devin, Sankar Subramanian, Balaji Purushothamanc, John E. Anthony, Thomas Jackson, David J. Gundlach

We report on a simple a method of inducing self-isolation of the thin film transistors via manipulation of the chemical interactions between the organic

The Origins of Random Telegraph Noise in Highly Scaled SiON nMOSFETs

October 17, 2008

Author(s)

Jason P. Campbell, Jin Qin, Kin P. Cheung, Liangchun (. Yu, John S. Suehle, A Oates, Kuang Sheng

Random telegraph noise (RTN) has recently become an important issue in advanced circuit performance. It has also recently been used as a tool for gate

The transient behavior of NBTI - A new prospective

October 17, 2008

Author(s)

Kin P. Cheung, Jason P. Campbell

The Negative-Bias-Temperature-Instability (NBTI) is currently one of the most serious reliability issues in advanced CMOS technology. Specifically, the fast

Re-calibration of the NIST SRM 2059 Master Standard using Traceable Atomic Force Microscope Metrology

October 17, 2008

Author(s)

Ronald G. Dixson, James E. Potzick, Ndubuisi G. Orji

The National Institute of Standards and Technology (NIST) has had a robust program in photomask dimensional metrology since the late 70s when the late Diana

International photomask linewidth comparison by NIST and PTB

October 17, 2008

Author(s)

James E. Potzick, Ronald G. Dixson, Richard Quintanilha, Michael T. Stocker, Andras Vladar, Egbert Buhr, Bernd Bodermann, Wolfgang Hassler-Grohne, Harald Bosse, C.G. Frase

In preparation of the international Nano1 linewidth comparison on photomasks between 8 national metrology institutes, NIST and PTB have started a bilateral

Standardization of Auxiliary Equipment for Next Generation CNC Machining

October 17, 2008

Author(s)

David Odendahl, Sid Venkatesh, John L. Michaloski, Frederick M. Proctor

This paper presents the recent work of the Open Modular Architecture Control (OMAC) Machine Tool Working Group to support STEP-NC, which is a new standard for

Dielectric Measurement Methods at Millimeter Wave Frequencies

October 16, 2008

Author(s)

Michael D. Janezic

We review several techniques for making accurate relative permittivity and loss tangent measurements of low-loss dielectric materials at frequencies between 30

NCWM Publication 5, National Type Evaluation Program - Index of Device Evaluationa, Tenth Edition, Supplement 1

October 16, 2008

Author(s)

L T. Sebring

This publication contains index listings and copies of Certificates of conformance for all devices that have been type evaluated under the National Type

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