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Near-Field Spherical Scanning: Uncertainties in Test-Zone Field Measurements

Published

Author(s)

Randy Direen, Ronald C. Wittmann, Michael H. Francis

Abstract

The electromagnetic field within a test volume can be measured using spherical scanning techniques. Characterization of the field within the sphere requires compensation for probe-pattern effects. We provide a simple uncertainty analysis to estimate uncertainties associated withthis deconvoltion
Conference Dates
November 16-21, 2008
Conference Location
Boston, MA
Conference Title
AMT 2008

Keywords

near-field meaurements, spherical scanning, test-zone evaluation, probe correction, uncertainty

Citation

Direen, R. , Wittmann, R. and Francis, M. (2008), Near-Field Spherical Scanning: Uncertainties in Test-Zone Field Measurements, AMT 2008, Boston, MA (Accessed May 24, 2024)

Issues

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Created November 16, 2008, Updated February 19, 2017