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Tam Duong

Mr. Duong is an electrical engineer in the Quantum Measurement Division of the Physical Measurement Laboratory (PML) at the National Institute of Standards and Technology (NIST). His research interests include (1) characterization, modeling, and simulation of power devices and (2) modeling, simulation, and design of power electronics circuits.

Publications

Electro-thermal Simulation of 1200 V 4H-SiC MOSFET Short-Circuit SOA

Author(s)
Tam H. Duong, Jose M. Ortiz, David W. Berning, Allen R. Hefner Jr., Sei-Hyung Ryu, John W. Palmour
The purpose of this paper is to introduce a dynamic electro-thermal simulation and analysis approach for device design and short-circuit safe-operating-area
Created October 1, 2019