Scott's research interests include fundamental measurements of electron induced X-ray specimen interactions, characterization and modeling of the primary electron scattering by gas molecules and its effect on quantitation in the environmental scanning electron microscope, and temperature dependent cathodoluminescence.
He is member of ASTM committee E42 on Surface Analysis, ISO TC 201 Committee on Surface Chemical Analysis, and ISO TC 202 Committee on Microbeam Analysis. He has been a member of the Microanalysis Society since 1990.
2010 US Department of Commerce Gold Medal Award
2010 Microbeam Analysis Society Presidential Service Award
2015 Materials Measurement Laboratory Accolades Award for Service to MML