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Patents

Displaying 1 - 9 of 9
Presentation of technologies with similar applications as Electron Relectometry

Electron Reflectometer and Process for Performing Shape Metrology

Inventors

Lawrence H. Friedman, Wen-Li Wu

Patent Description It has been discovered that an electron reflectometer and process for performing shape metrology provide electron reflectometry (ER) for measurement or determination of nanoscale dimensions in three dimensions at a surface with small-angle electron reflection. According to Fresnel
Line drawing of the method for manufacturing an array of sensors on a single chip

Method for Manufacturing an Array of Sensors on a Single Chip

Inventors

Abhishek Motayed, Geetha S. Aluri, Albert Davydov, Vladimir P. Oleshko, Ritu Bajpai, Mona E. Zaghloul

Patent Description Detection of chemical species in air, such as industrial pollutants, poisonous gases, chemical fumes, and volatile organic compounds (VOCs), is vital for the health and safety of communities around the world. The development of reliable, portable gas sensors that can detect
Powerpoint slide, showing via map and photograhpy, the distance from NIST Boulder to Valmont Butte

Optical Time Distributor and Process for Optical Two-Way Time-Frequency Transfer

Inventors

Laura Sinclair, Nathan R. Newbury, William C. Swann, Hugo Bergeron, Jean-Daniel Deschenes

Patent Description The invention is a method to compare and synchronize "clocks" (i.e. local timescales) through optical links across free space, which include open air paths through the atmosphere to other terrestrial sites or to satellites, as well as satellite-to-satellite paths. The challenge is
The figure shows a microfabricated optical probe with the following components: 110 - optical loop, 111 – structured region of 110, 114 – optical waveguide, 116 – first arm of optical  waveguide, 120 – substrate, 122 – optical cladding layer, 124 – first single mode optical fiber, 126 – primary light, and 128 – output light.

Microfabricated Optical Probe

Inventors

Vladimir Aksyuk, Kartik Srinivasan, Thomas Michels

Patent Description Integrated photonics research and manufacturing requires a probe for in-line nondestructive optical testing of devices. Current optical probes require dedicated and large coupling areas in the photonic circuit. They cannot provide sufficient control over the degree, location and
Collage of images; magnetic imaging of live bacteria and nanoscale thermometry of live human cells.

Fast Entangled State Generation and Quantum Information Transfer in a Quantum System with Long-Range Interactions

Inventors

Alexey V. Gorshkhov, Michael Foss-Feig, Zachary Eldredge, Ali Hamed Moosavian, Jeremy Young, Zhe-Xuan Gong

Patent Description NIST has developed a method to use quantum systems with long-range interactions to do the following two things faster (in some cases exponentially faster) than in systems with short-range interactions: (1) accomplish quantum state transfer across the system; (2) prepare a large

Photonic probe for atomic force microscopy

Inventors

Marcelo Davanco, Vladimir Aksyuk

Patent Description Atomic force microscopy probes with integrated photonic optomechanical cavity readout are new and provide improved sensitivity, increased measurement speed and reduced measurement noise in a variety of research and manufacturing metrology applications. While such probes have been
Image of Resonators fabricated into a micro-electro-mechanical Systems devices as built-in motion testers

Localized gap plasmon resonator

Inventors

Brian J. Roxworthy, Alexander J. Liddle, Vladimir Aksyuk

Patent Description This invention is a motion sensor, and the unique fabrication process required to build the sensor, that uses the strong sensitivity of plasmonic modes to geometrical parameters (e.g. gap size). The measurement technique is experimentally validated by detecting thermal motion of a
Image of 2 security officers inspecting packages

Anti-Counterfeiting Article, Process for Making and Using Same

Inventors

Yaw S. Obeng, Joseph J. Kopanski, Jung-Joon Ahn

Patent Description This invention provides for a new and useful metrology to enable counterfeit detection system capable of uniquely marking items by encoding information in their physical structure at the nanoscale. The system depends on rapidly encoding information in the physical structure of an
Displaying 1 - 9 of 9