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Special Publication (NIST SP)

Semiconductor Measurement Technology: Evolution of Silicon Materials Characterization: Lessons Learned for Improved Manufacturing

July 1, 1993

Author(s)

W M. Bullis

Application Portability Profile (APP) The U. S. Government's Open System Environment Profile OSE/1 Version 2

June 9, 1993

Author(s)

Gary Fisher

The focus of this guide is on open system environments (OSE) which integrate POSIX, GOSIP, and other specifications to provide the functionality necessary to

Semiconductor Measurement Technology: A Collection of Computer Programs for Two-Probe Resistance (Spreading Resistance) and Four-Probe Resistance Calculations: RESPAC

June 1, 1993

Author(s)

John Albers, H. L. Berkowitz

The First Text REtrieval Conference (TREC-1)

May 1, 1993

Author(s)

Donna K. Harman

Manual for Data Administration

April 1, 1993

Author(s)

J J. Newton

Software Error Analysis

March 1, 1993

Author(s)

W W. Peng, D Wallace

NIST's Manufacturing Technology Centers Program: A Collection of Successful Interactions Between the MTCs and Client Firms

January 1, 1993

Author(s)

R D. Suenram

Accurate Wave-lengths and Isotope Shifts for Lines of Doubly-Ionized Mercury (Hg III) of Astrophysical Interest, ed. by J. Sugar and D. Leckrone

January 1, 1993

Author(s)

Craig J. Sansonetti, Reader j

Critically Evaluated Data on Atomic Spectra-Energy Levels, Wavelengths and Transition Probabilities, ed. by J. Sugar and D. Leckrone

January 1, 1993

Author(s)

William C. Martin, Arlene Musgrove, Joseph Reader, J Sugar, Wolfgang L. Wiese, Jeffrey R. Fuhr, G R. Dalton, T Shirai

Update on the NIST EBIT

January 1, 1993

Author(s)

John D. Gillaspy, J R. Roberts, C M. Brown, Uri Feldman

Bibliography on Atomic Line Shapes and Shifts (July 1978 through March 1992)

January 1, 1993

Author(s)

Jeffrey R. Fuhr, A Lesage

The Atomic Branching Ratio Project at NIST, ed. by J. Sugar and D. Leckrone

January 1, 1993

Author(s)

J Klose, Wolfgang L. Wiese

Transition Probabilities and Lifetimes of Ar I, ed. by J. Sugar and D. Leckrone

January 1, 1993

Author(s)

V Helbig, Daniel E. Kelleher, Wolfgang L. Wiese

A Guide to the Selection of Anti-Virus Tools and Techniques

December 1, 1992

Author(s)

William T. Polk, Lawrence E. Bassham

Computer viruses continue to pose a threat to the integrity and availability of computer systems. This is especially true for users of personal computers. A

Automated Tools for Testing Computer System Vulnerability

December 1, 1992

Author(s)

William T. Polk

Computer security "incidents" occur with alarming frequency. The incidents range from direct attacks by both hackers and insiders to automated attacks such as

Stable Implementation Agreements for Open Systems Interconnection Protocols, Version 6, Edition 1, December 1992 Superseded by NISTSP 500-214

December 1, 1992

Author(s)

Frederick E. Boland Jr.

Guidelines for the Evaluation of VirtuaL Terminal Implementations

November 1, 1992

Author(s)

C E. Edgar

High Integrity Software Standards and Guidelines

September 1, 1992

Author(s)

D Wallace, L M. Ippolito, David R. Kuhn

Conformance Test NISTSPecifications for COBOL Intrinsic Function Module

July 1, 1992

Author(s)

C Montanez-rivera, L A. Johnson

Semiconductor Measurement Technology: INSTANT - IGBT Network Simulation and Transient ANalysis Tool

June 1, 1992

Author(s)

Allen R. Hefner Jr.

Semiconductor Measurement Technology: Version 2.0 of the TXYZ Thermal Analysis Program: TXYZ20

June 1, 1992

Author(s)

John Albers

Semiconductor Measurement Technology: Evaluating a Chip, Wafer, or Lot Using SUXES, SPICE, and STAT2

April 1, 1992

Author(s)

Janet M. Cassard, R. L. Mattis

Computer Security Considerations in Federal Procurements: A Guide for Procurement Initiators, Contracting Officers, and Computer Security Officials

March 2, 1992

Author(s)

Barbara Guttman

[Superseded by SP 800-64 (October 2003): http://www.nist.gov/manuscript-publication-search.cfm?pub_id=917469] This NIST Special Publication provides guidance

The Manufacturing Technology Centers Program, A Sampling of Individual Case Histories

January 1, 1992

Author(s)

R D. Suenram

Technical Digest Symposium on Optical Fiber Measurements, 1992

January 1, 1992

Author(s)

Gordon W. Day, Douglas L. Franzen

Standard Reference Materials: Antireflecting-Chromium Linewidth Standard, SRM 475, for Calibration of Optical Microscope Linewidth Measuring Systems

January 1, 1992

Author(s)

C. F. Vezzetti, R. N. Varner, James E. Potzick

Reference Model for Frameworks of Software Engineering Environments (Technical Report ECMA TR/55, 2nd Edition)

December 4, 1991

Author(s)

Roger J. Martin

This document describes a reference model (RM) for Software Engineering Environment (SEE) Frameworks. This clause provides some motivation for the work

Stable Implementation Agreements for Open Systems Interconnection Protocols, Version 5, Edition 1, December 1991 (See 500-206 latest version)

December 1, 1991

Author(s)

Frederick E. Boland Jr.

Development of a Testing Methodology to Predict Optical Disk Life Expectancy Values

December 1, 1991

Author(s)

F L. Podia

The 3480 Type Tape Cartridge Potential Data Storage Risks, and Care and Handling Procedures to Minimize Risks

November 5, 1991

Author(s)

Mark P. Williamson

The National Institute of Standards and Technology (NIST), under the sponsorship of NOAA, has undertaken an appraisal of the potential risks associated with the

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