Albers, J.
(1995),
Semiconductor Measurement Technology: HOTPAC: Programs for Thermal Analysis Including Version 3.0 of the TXYZ Program, TXYZ30, and the Thermal MultiLayer Program, TML, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD
(Accessed April 19, 2024)
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Semiconductor Measurement Technology: HOTPAC: Programs for Thermal Analysis Including Version 3.0 of the TXYZ Program, TXYZ30, and the Thermal MultiLayer Program, TML
Published
Author(s)
Citation
Special Publication (NIST SP) -
Volume
400
Issue
96
NIST Pub Series
Pub Type
NIST Pubs
Citation
Created August 1, 1995, Updated February 17, 2017