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Semiconductor Measurement Technology: HOTPAC: Programs for Thermal Analysis Including Version 3.0 of the TXYZ Program, TXYZ30, and the Thermal MultiLayer Program, TML

Published

Author(s)

John Albers
Citation
Special Publication (NIST SP) -
Volume
400
Issue
96

Citation

Albers, J. (1995), Semiconductor Measurement Technology: HOTPAC: Programs for Thermal Analysis Including Version 3.0 of the TXYZ Program, TXYZ30, and the Thermal MultiLayer Program, TML, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD (Accessed June 23, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created August 1, 1995, Updated February 17, 2017