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Nanotechnology

Nanofabrication / manufacturing

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Detecting Effects of 3D Shapes in Nanoscale Chip Features

April 27, 2015

As microchip feature dimensions approach atomic scale, it becomes formidably difficult to measure their size and shape. According to the International...

Nanoelectronics Conference Focuses on Future of Semiconductor Manufacturing

April 22, 2015

The characterization technology needed for nanoelectronic materials and device research, development, and manufacturing was discussed by experts from industry...

Autonomous Atom Assembly of Nanostructures using a Scanning Tunneling Microscope

February 13, 2015

NIST researchers have demonstrated the autonomous computer-controlled assembly of atoms into perfect nanostructures using a low temperature scanning tunneling...

PML Scientists Discover a Better Metal Contact that Improves Two-Dimensional Transistor Performance

January 16, 2015

Two-dimensional (2D) materials* such as molybdenum-disulfide (MoS 2) are attracting much attention for future electronic and photonic applications ranging from...

Uniform Nanowire Arrays for Science and Manufacturing

December 2, 2014

Defect-free nanowires with diameters in the range of 100 nanometers (nm) hold significant promise for numerous in-demand applications including printable...

Measuring Absorption Maps and Spectra of Plasmonic Resonators with Nanoscale Resolution

September 10, 2014

Researchers from the NIST Center for Nanoscale Science and Technology (CNST) and the University of Maryland have for the first time used photothermal induced...

Manipulating Magnetic Field Effects in Organic Semiconductors

July 10, 2014

Changing the polarity of the magnetic field response of a material one thousandth the width of a human hair may seem like the stuff of science fiction, but that...

Small image of the CNST News Winter-Spring 2014 Cover

CNST Releases the Winter/Spring 2014 Edition of the CNST News

May 28, 2014

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the Winter/Spring 2014 edition of The CNST News. This...

Don't Blink! NIST Studies Why Quantum Dots Suffer from 'Fluorescence Intermittency'

May 20, 2014

Researchers at the National Institute of Standards and Technology (NIST), working in collaboration with the Naval Research Laboratory, have found that a...

Now You See It: Electromagnetically Induced Transparency in a Silicon Nitride Optomechanical Crystal

April 9, 2014

Researchers from the NIST Center for Nanoscale Science and Technology (CNST) have observed electromagnetically induced transparency at room temperature and...

Electron beam induced current (red) superimposed on a scanning electron micrograph (gray). Bright contrast in the vicinity of grain boundaries indicates that these regions have higher carrier collection efficiency than the grain interiors.

Characterizing Solar Cells with Nanoscale Precision Using a Low-Energy Electron Beam

December 4, 2013

Researchers from the NIST Center for Nanoscale Science and Technology (CNST) have demonstrated a new low energy electron beam technique and used it to probe the...

The NIST Center for Nanoscale Science and Technology Develops and Deploys New NanoFab Management System

November 18, 2013

The Center for Nanoscale Science and Technology (CNST), NIST's nanotechnology user facility, has deployed a new laboratory equipment management system which it...

CNST Releases the Fall 2013 Edition of The CNST News

November 14, 2013

The NIST Center for Nanoscale Science and Technology (CNST) is pleased to announce the release of the Fall 2013 edition of The CNST News. This quarterly...

The NIST Center for Nanoscale Science and Technology Launches Updated NanoFab Website

October 28, 2013

The Center for Nanoscale Science and Technology (CNST), NIST's nanotechnology user facility, is pleased to announce a major update to the NanoFab website. The...

Nanowire Position and Orientation Precisely Controlled Using Fluid Flow

April 11, 2013

Video showing a 10 µm × 1 µm fluorescently labeled rod being controlled using a combination of electric fields and fluid flow to travel along the "NIST" path...

NIST Center for Nanoscale Science and Technology Featured on National Public Radio Affiliate WAMU

April 3, 2013

The NIST Center for Nanoscale Science and Technology (CNST) was featured on the Friday, March 22 edition of Metro Connection, a weekly radio broadcast of...

CNST Director Robert Celotta Featured in European Innovation Publication

March 20, 2013

Robert Celotta, Director of the NIST Center for Nanoscale Science and Technology (CNST), was interviewed in the 2013 edition of International Innovation -...

Nanoelectronics Conference Will Focus on Semiconductor Industry's Future

March 5, 2013

How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 International Conference...

Calculating Quantum Vacuum Forces in Nanostructures

February 7, 2013

One of the surprising predictions of quantum mechanics is that uncharged conductors can attract each other over small distances, even in empty space. While the...

Controlling Particles for Directed Self-Assembly of Colloidal Crystals

January 17, 2013

Researchers from the NIST Center for Nanoscale Science and Technology and the Johns Hopkins University have developed a technique to reliably manipulate...

Bright field transmission electron micrograph showing carbon nanotubes grown from an array of equally-sized iron catalyst particles created by electron beam-induced decomposition of a diiron nonacarbonyl precursor.

Researchers Observe, Control, and Optimize the Growth of Individual Carbon Nanotubes

October 31, 2012

Researchers from the NIST Center for Nanoscale Science and Technology and Arizona State University have used an environmental scanning transmission electron...

Slip Sliding Our Way: At the Nanoscale, Graphite Can Turn Friction Upside Down

October 16, 2012

If you ease up on a pencil, does it slide more easily? Sure. But maybe not if the tip is sharpened down to nanoscale dimensions. A team of researchers at the...

False-color SEMs of cross-sectioned hematite films.

Researchers Determine Critical Factors for Improving Performance of a Solar Fuel Catalyst

October 3, 2012

Hydrogen gas that is created using solar energy to split water into hydrogen and oxygen has the potential to be a cost-effective fuel source if the efficiency...

False-color scanning electron micrograph of a nanophotonic motion sensor.

A Fast and Sensitive Nanophotonic Motion Sensor Developed for Silicon Microdevices

September 19, 2012

Using a microscopic optical sensor that can be batch-fabricated on a silicon chip at low cost, Researchers from the NIST Center for Nanoscale Science and...

NIST 'Hybrid Metrology' Method Could Improve Computer Chips

September 5, 2012

A refined method developed at the National Institute of Standards and Technology (NIST) for measuring nanometer-sized objects may help computer manufacturers...

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