News and Updates

Displaying 1 - 25 of 35

NIST Engineers Support Vendor Implementations of STEP to Evolve Digital Manufacturing

November 1, 2024

In September 2024, NIST Engineers Rosemary Astheimer and Allison Barnard Feeney participated in meetings held by the MBx Interoperability Forum - a

NIST Engineer Presents at Women in Manufacturing Summit

November 1, 2024

In October 2024, NIST Researcher Rosemary Astheimer presented at the 2024 Women in Manufacturing Summit in Boston, Massachusetts. The Summit, attended by over 2

NIST Researchers Present Tutorial on Discrete-Event Manufacturing Simulation Using Open-Source SimPROCESD Environment

July 1, 2024

At the 2024 Annual Modeling and Simulation Conference (ANNSIM) in Washington, DC, NIST researchers Serghei Drozdov and Mehdi Dadfarnia gave a 90-minute tutorial

Save the Date - 2025 MBE & QIF Summit April 15-17, 2025

June 25, 2024

In 2024, the MBE Summit in-person event returned and combined with the QIF Summit. The event was held from April 16-19, 2024 at MxD (Manufacturing x Digital)

NIST Engineers Lead and Present at 2024 MBE & QIF Summit

May 1, 2024

In April 2024, MxD (Manufacturing x Digital) hosted the 2024 MBE & QIF Summit which was jointly organized by NIST and the DMSC (Digital Metrology Standards

MBE & QIF Summit 2024

April 16, 2024

The MBE Summit has brought academia, government, and industry experts together for over 10 years to share the challenges, implementation issues, and lessons

NIST Engineer Presents the Blood, STEP, and Tears Involved in Digital Manufacturing Standards

April 1, 2024

In March 2024, NIST’s Rosemary Astheimer presented efforts to capture and leverage Product Manufacturing Information (PMI) in ISO 10303, referred to as STEP

New Resource Available: The Foundations for a Successful Business

June 5, 2023

To be successful as a new business, a growing business, or a well-established business exploring major changes, what do you most need to consider? The 2023-2024

NIST Engineer Offers a Way to Realize the Digital Thread in Manufacturing

June 1, 2023

In May 2023, CIMdata sponsored the 2023 PLM Roadmap & PDT conference, which focused on advancing an understanding of the Digital Thread – moving product

NIST Scientists Develop Novel CT Scan Device for Integrated Circuits

April 14, 2023

Researchers at the National Institute of Standards and Technology (NIST) and their colleagues have developed a novel tabletop device that takes three

Are Condition Monitoring Systems Worth It? NIST Researchers Offer Way to Evaluate

December 1, 2022

Industries may use "condition monitoring systems" (CMS) to monitor machines and enterprises – like production lines – for detrimental or unexpected changes in

Entering a New Phase: NIST Technique Simultaneously Locates Multiple Defects on Microchip Circuits

November 3, 2022

Defective computer chips are the bane of the semiconductor industry. Even a seemingly minor flaw in a chip packed with billions of electrical connections might

No Fib: NIST Unmasks a Superfast Process for Nanoscale Machining

August 23, 2022

Cutting intricate patterns as small as several billionths of a meter deep and wide, the focused ion beam (FIB) is an essential tool for deconstructing and

A hollow semicircle of metal has much thinner metal scaffolding inside the hollow area.

NIST Awards Nearly $4 Million to Support Metals-Based Additive Manufacturing

July 26, 2022

The grants will help address current and future barriers to widespread adoption of metals-based additive manufacturing through measurement science research.

Strobe Light for 5G: NIST Imaging System Spotlights the Tiny Mechanical Hearts at the Core of Every Cellphone

February 4, 2022

Inside every cellphone lies a tiny mechanical heart, beating several billion times a second. These micromechanical resonators play an essential role in

NIST Researchers Resurrect and Improve a Technique for Detecting Transistor Defects

February 3, 2022

Researchers at the National Institute of Standards and Technology (NIST) have revived and improved a once-reliable technique to identify and count defects in

NIST, Collaborators Develop Sensitive New Way of Detecting Transistor Defects

October 7, 2021

Researchers at the National Institute of Standards and Technology (NIST) and collaborators have devised and tested a new, highly sensitive method of detecting

A Smart Use for Doping: Implanted Atoms Create Unique Electrical IDs That Distinguish Bona Fide Devices From Forgeries

September 16, 2021

If someone sells you a luxury handbag from Paris, France, but it turns out be a forgery from Paris, Texas, the counterfeit item might cost you a thousand bucks

As Good as it Gets: NIST Develops Its Fourth Generation Wire Micrometer that Rivals Best in the World

March 11, 2021

Researchers at the National Institute of Standards and Technology (NIST) have developed a dramatically improved laser-based instrument that measures the

Researcher Brandon Lane making adjustments inside the large 3D printer

NIST Awards Nearly $4 Million to Support Metals-Based Additive Manufacturing

December 29, 2020

GAITHERSBURG, Md. — The U.S. Department of Commerce’s National Institute of Standards and Technology has awarded nearly $4 million in grants to help accelerate

A novel, low-cost method detects nanoscale contaminants during manufacture of semiconductor devices

October 19, 2020

As computer chips and other electronic devices continue to shrink in size, they become ever more sensitive to contamination. However, detecting the nanoscale

Helping Laser Scanners Measure Up

April 23, 2020

Scientists at the National Institute of Standards and Technology (NIST) have devised a novel, accurate, easy-to-operate, time- and labor-saving way to provide

Opposite sides of a quartz crystal resonator

Universe in the Balance

February 12, 2020

Researchers at the National Institute of Standards and Technology (NIST) have found a way to link measurements made by a device integral to microchip

Avoiding the Crack of Doom

February 25, 2019

Just as a journey of 1,000 miles begins with a single step, the deformations and fractures that cause catastrophic failure in materials begin with a few

After 90 Years, a Better Way to Measure the Composition of Paper

February 14, 2019

Researchers at the National Institute of Standards and Technology (NIST), in collaboration with the U.S. Government Publishing Office (GPO), have developed a

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