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Electronics

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Protecting the Nation's Critical Infrastructure

June 20, 2013

Guest blog post by Patrick Gallagher, Under Secretary of Commerce for Standards and Technology and Director, National Institute of Standards and Technology Just...

Multiple views of NIST's photoelectrochemical hydrogen cell.

NIST Demonstrates Significant Improvement in the Performance of Solar-Powered Hydrogen Generation

May 14, 2013

Using a powerful combination of microanalytic techniques that simultaneously image photoelectric current and chemical reaction rates across a surface on a...

New 3D Defect Detection Fills Important Industry Gap

May 13, 2013

As device manufacturing technologies sizes shrink beyond 22 nm and increase in complexity, defects become more detrimental to device performance and harder to...

New Temporal Filtering Technique Improves Solid-State Single Photon Sources

May 8, 2013

An international collaboration led by researchers from the NIST Center for Nanoscale Science and Technology (CNST) has demonstrated a novel temporal filtering...

PML Researchers Open Door to Advanced Molecular Electronic Metrology

April 12, 2013

Continued advancements using a NIST-developed molecular-level fabrication technique are leading to new discoveries in the metrology for molecular electronics by...

New NIST Microscope Measures Nanomagnet Property Vital to 'Spintronics'

March 14, 2013

Researchers at the National Institute of Standards and Technology (NIST) have developed a new microscope able to view and measure an important but elusive...

PML Scientists Make Better SEM Imaging and Measurements in the Nano Era Possible

March 14, 2013

Since the inception of the scanning electron microscope (SEM), users have encountered the persistent problem of contamination. Cleanliness is required for...

Nanoelectronics Conference Will Focus on Semiconductor Industry's Future

March 5, 2013

How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 International Conference...

High Efficiency in the Fastest Single-Photon Detector System

February 19, 2013

A single photon may not seem like much of a catch. But detecting photons one-by-one with near-perfect reliability is formidably difficult. It is also an...

Marlin Kraft adjusts a current shunt connection.

Minimizing Uncertainty in Current Events

January 28, 2013

The electrical power industry – and the equipment makers and calibration laboratories that serve it – need to be able to quantify DC currents of hundreds or...

Photons Emitted by Quantum Dots Can be Made Indistinguishable Through Quantum Frequency Conversion

December 19, 2012

An international collaboration led by researchers from the NIST Center for Nanoscale Science and Technology has demonstrated the ability to make photons emitted...

Electron Spin Transport Demonstrated for First Time in an Organic Device

December 14, 2012

Researchers in the Semiconductor and Dimensional Metrology Division's Nanoelectronic Device Metrology (NEDM) Project have demonstrated the first documented case...

New Platform Developed to Measure and Exploit Optomechanical Interactions

December 12, 2012

Researchers from the NIST Center for Nanoscale Science and Technology and Caltech have developed a new design platform for measuring and exploiting strong...

New NIST Document Offers Guidance in Cryptographic Key Generation

December 12, 2012

Protecting sensitive electronic information in different situations requires different types of cryptographic algorithms, but ultimately they all depend on keys...

'Magic Zero' Technique Reduces Atomic Clock Uncertainty

December 5, 2012

Scientists from a PML- Joint Quantum Institute (JQI)* group have devised and demonstrated a novel method** for making the most precise measurements to date of...

NIST – VA Agreement Leads to New Research on Hearing Aids

November 30, 2012

Randy Wagner and the rest of the Acoustics Team in PML's Semiconductor and Dimensional Metrology Division are planning new research directions as they celebrate...

1000 Calibration Reports . . . And Counting

November 21, 2012

The U.S. Internet – and indeed any communication system that sends information by fiber-optic cable – depends critically on strong, clear signals propagating...

Enriched Silicon: Going for Four Nines

November 20, 2012

Any eventual quantum computer, no matter how it may be configured, will need a way to store and manipulate information in qubits – the quantum counterpart of a...

Coming Soon: Tabletop Molecular Movies

November 5, 2012

One of the most urgently sought-after goals in modern science is the ability to observe the detailed dynamics of chemical reactions as they happen – that is, on...

New Boulder Clean Room Open for Business

November 2, 2012

After months of construction, installation, troubleshooting, and testing, the new clean room at NIST's Precision Measurement Laboratory complex on the Boulder...

A green laser beam rotates around the toroidal BEC, acting as a sort of "optical paddle."

The First Controllable Atom SQUID

November 2, 2012

Scientists have created the first controllable atomic circuit that functions analogously to a superconducting quantum interference device (SQUID) and allows...

Bright field transmission electron micrograph showing carbon nanotubes grown from an array of equally-sized iron catalyst particles created by electron beam-induced decomposition of a diiron nonacarbonyl precursor.

Researchers Observe, Control, and Optimize the Growth of Individual Carbon Nanotubes

October 31, 2012

Researchers from the NIST Center for Nanoscale Science and Technology and Arizona State University have used an environmental scanning transmission electron...

NRI to Lead New Five-Year Effort to Develop Post-CMOS Electronics

October 16, 2012

The National Institute of Standards and Technology (NIST) announced today the selection of the Nanoelectronics Research Initiative (NRI), a collaboration of...

Near-Field Scanning Microwave Microscope: Big at the Nanoscale

September 28, 2012

NIST's ability to determine the composition and physics of nanoscale materials and devices is about to improve dramatically with the arrival of a new near-field...

September Workshop to Explore the Measurement Needs of the Flexible Electronics Industry

September 5, 2012

The National Institute of Standards and Technology (NIST), in concert with the FlexTech Alliance, will hold a workshop on "Flexible Printed Electronics...

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