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Electronics

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Quantum Physics Could Make Secure, Single-Use Computer Memories Possible

January 14, 2014

Computer security systems may one day get a boost from quantum physics, as a result of recent research from the National Institute of Standards and Technology...

High-Tech Measurements for High-Frequency Antennas

November 14, 2013

A team of researchers at NIST's Antenna Metrology Lab in Boulder, CO has devised a first-of-its-kind system – combining a precision 3-meter industrial robot arm...

Perfect Faults: A Self-Correcting Crystal May Unleash the Next Generation of Advanced Communications

November 5, 2013

Researchers from the National Institute of Standards and Technology (NIST) have joined with an international team to engineer and measure a potentially...

NIST/JQI Team 'Gets the Edge' on Photon Transport in Silicon

October 22, 2013

Scientists have a new way to edge around a difficult problem in quantum physics, now that a research team from the National Institute of Standards and...

NTIA and NIST to host Innovative Spectrum Sharing Technology Day Event

October 21, 2013

Additional Contact: Juliana Gruenwald, NTIA, 202-482-2145 WASHINGTON – The U.S. Commerce Department's National Telecommunications and Information Administration...

NIST Unveils Prototype Video Imaging System for Remote Detection of Hidden Threats

September 30, 2013

By adapting superconducting technology used in advanced telescope cameras, researchers at the National Institute of Standards and Technology (NIST) have built a...

The Persistence of Memory: Looking into MRAM

August 5, 2013

Many in the electronics industry want to change how memories are made. So PML scientists are exploring the physics and developing the metrology required to do...

NIST Chip Measurement Advance Earns 'Oscar of Innovation'

July 12, 2013

A fundamental advance in measurement capabilities that could save semiconductor manufacturers billions of dollars annually has earned a 2013 R&D 100 Award for...

Microscopy Technique Could Help Computer Industry Develop 3-D Components

June 25, 2013

A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has been applied to...

Protecting the Nation's Critical Infrastructure

June 20, 2013

Guest blog post by Patrick Gallagher, Under Secretary of Commerce for Standards and Technology and Director, National Institute of Standards and Technology Just...

Multiple views of NIST's photoelectrochemical hydrogen cell.

NIST Demonstrates Significant Improvement in the Performance of Solar-Powered Hydrogen Generation

May 14, 2013

Using a powerful combination of microanalytic techniques that simultaneously image photoelectric current and chemical reaction rates across a surface on a...

New 3D Defect Detection Fills Important Industry Gap

May 13, 2013

As device manufacturing technologies sizes shrink beyond 22 nm and increase in complexity, defects become more detrimental to device performance and harder to...

New Temporal Filtering Technique Improves Solid-State Single Photon Sources

May 8, 2013

An international collaboration led by researchers from the NIST Center for Nanoscale Science and Technology (CNST) has demonstrated a novel temporal filtering...

PML Researchers Open Door to Advanced Molecular Electronic Metrology

April 12, 2013

Continued advancements using a NIST-developed molecular-level fabrication technique are leading to new discoveries in the metrology for molecular electronics by...

New NIST Microscope Measures Nanomagnet Property Vital to 'Spintronics'

March 14, 2013

Researchers at the National Institute of Standards and Technology (NIST) have developed a new microscope able to view and measure an important but elusive...

PML Scientists Make Better SEM Imaging and Measurements in the Nano Era Possible

March 14, 2013

Since the inception of the scanning electron microscope (SEM), users have encountered the persistent problem of contamination. Cleanliness is required for...

Nanoelectronics Conference Will Focus on Semiconductor Industry's Future

March 5, 2013

How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 International Conference...

High Efficiency in the Fastest Single-Photon Detector System

February 19, 2013

A single photon may not seem like much of a catch. But detecting photons one-by-one with near-perfect reliability is formidably difficult. It is also an...

Marlin Kraft adjusts a current shunt connection.

Minimizing Uncertainty in Current Events

January 28, 2013

The electrical power industry – and the equipment makers and calibration laboratories that serve it – need to be able to quantify DC currents of hundreds or...

Photons Emitted by Quantum Dots Can be Made Indistinguishable Through Quantum Frequency Conversion

December 19, 2012

An international collaboration led by researchers from the NIST Center for Nanoscale Science and Technology has demonstrated the ability to make photons emitted...

Electron Spin Transport Demonstrated for First Time in an Organic Device

December 14, 2012

Researchers in the Semiconductor and Dimensional Metrology Division's Nanoelectronic Device Metrology (NEDM) Project have demonstrated the first documented case...

New Platform Developed to Measure and Exploit Optomechanical Interactions

December 12, 2012

Researchers from the NIST Center for Nanoscale Science and Technology and Caltech have developed a new design platform for measuring and exploiting strong...

New NIST Document Offers Guidance in Cryptographic Key Generation

December 12, 2012

Protecting sensitive electronic information in different situations requires different types of cryptographic algorithms, but ultimately they all depend on keys...

'Magic Zero' Technique Reduces Atomic Clock Uncertainty

December 5, 2012

Scientists from a PML- Joint Quantum Institute (JQI)* group have devised and demonstrated a novel method** for making the most precise measurements to date of...

NIST – VA Agreement Leads to New Research on Hearing Aids

November 30, 2012

Randy Wagner and the rest of the Acoustics Team in PML's Semiconductor and Dimensional Metrology Division are planning new research directions as they celebrate...

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