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Researchers from the National Institute of Standards and Technology (NIST) have joined with an international team to engineer and measure a potentially
Additional Contact: Juliana Gruenwald, NTIA, 202-482-2145 WASHINGTON – The U.S. Commerce Department's National Telecommunications and Information Administration
By adapting superconducting technology used in advanced telescope cameras, researchers at the National Institute of Standards and Technology (NIST) have built a
Many in the electronics industry want to change how memories are made. So PML scientists are exploring the physics and developing the metrology required to do
A fundamental advance in measurement capabilities that could save semiconductor manufacturers billions of dollars annually has earned a 2013 R&D 100 Award for
A technique developed several years ago at the National Institute of Standards and Technology (NIST) for improving optical microscopes now has been applied to
Guest blog post by Patrick Gallagher, Under Secretary of Commerce for Standards and Technology and Director, National Institute of Standards and Technology Just
Using a powerful combination of microanalytic techniques that simultaneously image photoelectric current and chemical reaction rates across a surface on a
As device manufacturing technologies sizes shrink beyond 22 nm and increase in complexity, defects become more detrimental to device performance and harder to
An international collaboration led by researchers from the NIST Center for Nanoscale Science and Technology (CNST) has demonstrated a novel temporal filtering
Continued advancements using a NIST-developed molecular-level fabrication technique are leading to new discoveries in the metrology for molecular electronics by
Since the inception of the scanning electron microscope (SEM), users have encountered the persistent problem of contamination. Cleanliness is required for
Researchers at the National Institute of Standards and Technology (NIST) have developed a new microscope able to view and measure an important but elusive
How the semiconductor industry can create the next generations of nanoscale computing technology will be one of the themes of the 2013 International Conference
A single photon may not seem like much of a catch. But detecting photons one-by-one with near-perfect reliability is formidably difficult. It is also an
The electrical power industry – and the equipment makers and calibration laboratories that serve it – need to be able to quantify DC currents of hundreds or
An international collaboration led by researchers from the NIST Center for Nanoscale Science and Technology has demonstrated the ability to make photons emitted
Researchers in the Semiconductor and Dimensional Metrology Division's Nanoelectronic Device Metrology (NEDM) Project have demonstrated the first documented case
Researchers from the NIST Center for Nanoscale Science and Technology and Caltech have developed a new design platform for measuring and exploiting strong
Protecting sensitive electronic information in different situations requires different types of cryptographic algorithms, but ultimately they all depend on keys
Scientists from a PML- Joint Quantum Institute (JQI)* group have devised and demonstrated a novel method** for making the most precise measurements to date of
Randy Wagner and the rest of the Acoustics Team in PML's Semiconductor and Dimensional Metrology Division are planning new research directions as they celebrate
The U.S. Internet – and indeed any communication system that sends information by fiber-optic cable – depends critically on strong, clear signals propagating
Any eventual quantum computer, no matter how it may be configured, will need a way to store and manipulate information in qubits – the quantum counterpart of a