To attend the Atom Probe Tomography and Microscopy Symposium (APT&M) with catering, the cost is $687.00. Without the catering service, the cost is $345.00.
Registration ends on 6/1/2018 at 11:59 PM EST
Call for Papers
The 6-day, biennial meeting is the premier international gathering of 200+ interdisciplinary researchers, in the fields of high field nanoscience and atom probe microscopy. Topics of interest have included: correlative techniques (e.g. electron tomography, SIMS, …); reconstruction methods; simulations, modeling and computational methods; field ion microscopy (FIM); laser-matter interactions; characterization of nanoscale materials and structures (metals, semiconductors, ceramics, organics, biologicals, and liquids); heat transfer at the nanoscale; optical properties at the nanoscale; instrument and technique development; and more! Ph.D. students, or recent graduates, are encouraged to submit an application package to the E.W. Müller Young Scientist Award Competition. As always, there will be plenty of opportunities for informal discussion of new techniques and applications as well as getting (re)connected with your fellow researchers.
Abstract Submission Deadline: January 31, 2018
- Abstracts should not exceed 1 page in length, including figures (see template ).
- Email abstracts to email@example.com.
- Abstract Status Notification Deadline: February 28, 2018.
Müller Application Deadline: January 31, 2018
Publication Submission Deadline: July 10, 2018
- We encourage authors to also submit a full-length paper for peer review/publication in a special APT&M 2018 issue of the journal, Microscopy and Microanalysis.
- A link to a submission portal will be posted shortly.
The full meeting registration includes breakfast and lunch, Monday-Thursday.
We look forward to seeing you at APT&M 2018!
Join our Twitter Chat using #APTM2018
If you are not registered, you will not be allowed on site. Registered attendees will receive security and campus instructions prior to the workshop.
NON U.S. CITIZENS PLEASE NOTE: All foreign national visitors who do not have permanent resident status and who wish to register for the above meeting must supply additional information. Failure to provide this information prior to arrival will result, at a minimum, in significant delays in entering the facility. Authority to gather this information is derived from United States Department of Commerce Department Administrative Order (DAO) number 207-12.
*New Visitor Access Requirement: Effective July 21, 2014, Under the REAL ID Act of 2005, agencies, including NIST, can only accept a state-issued driver’s license or identification card for access to federal facilities if issued by states that are REAL ID compliant or have an extension. As of Monday, January 30, 2017, Federal agencies will be prohibited from accepting driver’s licenses and identification cards from the following states for accessing federal facilities: Maine, Minnesota, Missouri, Montana and Washington. For further details, please visit: https://www.nist.gov/about-nist/visit/campus-access-and-security
Acceptable Photo Identification:
For Non-US Citizens: Valid passport for photo identification
For US Permanent Residents: Permanent Resident/Green card for photo identification