Atom Probe Tomography and Microscopy 2018
The 6-day, biennial meeting is the premier international gathering of 200+ interdisciplinary researchers, in the fields of high field nanoscience and atom probe microscopy. Topics of interest have included: correlative and combined techniques (e.g. electron tomography, SIMS, …); reconstruction methods; simulations, modeling and computational methods; field ion microscopy (FIM); laser-matter interactions; characterization of nanoscale materials and structures (metals, non-metals, semiconductors, organics, biologicals, and liquids); heat transfer at the nanoscale; optical properties at the nanoscale; instrument and technique development; and more! As always, there will be plenty of opportunities for informal discussion of new techniques and applications as well as getting (re)connected with your fellow researchers.
The APT&M 2018 Extended Submission Deadline (31 January) has now passed.
Full-Length Publication Submission Deadline: July 10, 2018
- We encourage authors to submit a full-length paper for peer review/publication in a special APT&M 2018 issue of the journal, Microscopy and Microanalysis.
- The submission portal is: https://mc.manuscriptcentral.com/mam
- Log-in or create a new account, then select “original paper” and “special issue APT&M2018”
Registration is Open.
We look forward to seeing you at APT&M 2018!
Join our Twitter Chat using #APTM2018
Security instructions
If you are not registered, you will not be allowed on site. Registered attendees will receive security and campus instructions prior to the workshop.
NON U.S. CITIZENS PLEASE NOTE: All foreign national visitors who do not have permanent resident status and who wish to register for the above meeting must supply additional information. Failure to provide this information prior to arrival will result, at a minimum, in significant delays in entering the facility. Authority to gather this information is derived from United States Department of Commerce Department Administrative Order (DAO) number 207-12.
NIST currently accepts the following forms of federally issued identification in lieu of a state-issued driver's license, such as a valid passport, passport card, DOD's Common Access Card (CAC), Veterans ID, Federal Agency HSPD-12 IDs, Military Dependents ID, Transportation Workers Identification Credential (TWIC), and TSA Trusted Traveler ID.
U.S. Residents: New Visitor Access Requirement: Effective July 21, 2014, under the REAL ID Act of 2005, agencies, including NIST, can only accept a state-issued driver's license or identification card from states that are REAL ID compliant or have an extension. See the Department of Homeland Security (DHS) site for the current compliance list.