The 6-day, biennial meeting is the premier international gathering of 200+ interdisciplinary researchers, in the fields of high field nanoscience and atom probe microscopy. Topics of interest have included: correlative and combined techniques (e.g. electron tomography, SIMS, …); reconstruction methods; simulations, modeling and computational methods; field ion microscopy (FIM); laser-matter interactions; characterization of nanoscale materials and structures (metals, non-metals, semiconductors, organics, biologicals, and liquids); heat transfer at the nanoscale; optical properties at the nanoscale; instrument and technique development; and more! As always, there will be plenty of opportunities for informal discussion of new techniques and applications as well as getting (re)connected with your fellow researchers.
The APT&M 2018 Extended Submission Deadline (31 January) has now passed.
Full-Length Publication Submission Deadline: July 10, 2018
- We encourage authors to submit a full-length paper for peer review/publication in a special APT&M 2018 issue of the journal, Microscopy and Microanalysis.
- The submission portal is: https://mc.manuscriptcentral.com/mam
- Log-in or create a new account, then select “original paper” and “special issue APT&M2018”
Registration is Open.
We look forward to seeing you at APT&M 2018!
Join our Twitter Chat using #APTM2018