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Organization

The International Field Emission Society (IFES) is an international scientific society that aims to promote high field nanoscience and atom probe microscopy.

The IFES is governed by its own charter that provides for an International Steering Committee (ISC) elected by the members. The Society's main duty is to run the International Field Emission Symposium that has recently been renamed Atom Probe Tomography & Microscopy (APT&M). 

This Symposium has been in existence since 1952 and currently meets every two years. APT&M 2018 will be held from June 10 to June 15, 2018 in the United States at the National Institute of Standards and Technology (NIST) in Gaithersburg, Maryland, just outside of Washington, D.C. It was at the 14th Field Emission Symposium, held at the National Bureau of Standards (now NIST) in 1967, that Erwin W. Müller and John A. Panitz first introduced the atom probe field ion microscope.

IFES Steering Committee

 

David Larson

 

 

2014

 

 

President

 

Cameca, Inc, Madison,

USA

François Vurpillot

2012

 

Vice-President

 

Groupe de Physique des Matériaux CNRS - UMR 6634

University of Rouen, Saint-Etienne du Rouvray, France

Gregory Thompson

2012

Secretary

The University of Alabama, Tuscaloosa, AL, USA

Michael Moody

2012

Treasurer

Department of Materials,

University of Oxford, Oxford, UK

July Cairney

2014

 

Australian Centre for Microscopy and Microanalysis

The University of Sydney, Sydney, Australia

Mattias Thuvander

 

2014

 

Chalmers University of Technology,

Gotenburg, Sweden

Stephan Gerstl

2012

 

EMEZ, ETH, Zurich, Switzerland

Gang Sha

APT&M 2016

 

Institute of Nuclear Physics and Chemistry, China Academy of Engineering Physics, Mian Yang, China

Ross Marceau

APT&M 2016

 

Deakin University, Institute for Frontier Materials, Geelong, Australia

Baptiste Gault

APT&M 2016

 

MPIE, Düsseldorf, Germany

 

Program and Planning Committee

  • Fred Meisenkothen, Chair, ex officio member IFES Steering Committee, NIST
  • Eric Steel, Co-Chair, NIST
  • Keana Scott, NIST
  • Scott Wight, NIST
  • Gladys Arrisueno, NIST
  • Ann Chiaramonti Debay, NIST
  • Keith Knipling, NRL
  • Karen Henry, BMPC
Created July 26, 2017, Updated February 16, 2018