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Material Measurement Laboratory /Materials Measurement Science Division

Nano Materials Research Group

We develop metrology to advance nanomaterial research and applications to benefit U.S. commerce. Our world-class measurement science determines the physical and chemical properties of a wide variety of organic, inorganic, biomolecular and hybrid systems, where materials are in the nanoscale regime. Our standards, methods, reference materials and measurement data advance a wide range of technologies and stimulate innovation.

News and Updates

Projects and Programs

Figure 1

Advanced Microscopy for Trace and Bulk Particle Characterization

Ongoing
The goal of this project is to help develop innovative metrologies and measurement protocols for micro/nano-scale analysis of particles. In this project, state-of-the-art optical and electron-based microscopy are used to conduct research for quantitative and qualitative analysis of chemical...
Nanomaterial-containing Drug Classes graphic

Metrology for Nanomaterials in Medicine

Ongoing
Drug products that incorporate nanomaterials are defined by FDA as non-biological complex drugs (NBCDs). NBCDs are a class of medical products that cannot be defined nor fully identified as traditional small-molecule drugs. NBCDs consist of different components that form a complex hybrid structure...

Microplastic and Nanoplastic Metrology

Ongoing
The Micro and Nanoplastic (MNP) Metrology Project aims to develop a toolbox of methods for size-based separations from complex matrices, chemical characterization protocols, and test materials necessary to enable quantification of micro- and nano-sized plastic particles, a need articulated by our...

Publications

Tools and Instruments

643 Axis Ultra DLD

X-ray Photoelectron Spectroscopy

The Material Measurement Science Division at NIST performs surface chemical analysis using X-ray Photoelectron Spectroscopy (XPS) with capabilities for routine
Nova NanoLab 600 (NNL600), a Focused Ion Beam Scanning Electron Microscope.

Focused Ion Beam

The Nova NanoLab 600 (NNL600) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase measurements

Awards

Headshot of Vincent A. Hackley, a man with short hair, glasses, and beard, smiling, wearing a suit and tie in front of a government building.

Vincent Hackley Honored by ASTM

In recognition of consistent dedication and outstanding service to ASTM Committee E56 on Nanotechnology since the committee’s inception in 2005.

Press Coverage

Nanoscale LED shines brighter

Physics World
"An innovative fin-shaped design for light-emitting diodes (LEDs) could not only overcome the devices’ limited brightness, it could also help turn them into...

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