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Materials

Materials characterization

Tools and Instruments

Keyword

Organizational Unit

Synchrotron X-ray Diffraction (XRD)

The X-ray diffraction (XRD) end station measures constructive interference of the x-ray wave with repeating atomic and interfacial structure in materials. At

TESCAN MIRA3 for automated electron microscopy

A TESCAN MIRA3 Schottky field-emission scanning electron microscope with 4 30 mm 2 silicon x-ray drift detectors which has been automated for particle and

The Solid-State NMR Facility

The newly renovated solid-state NMR facility at the NIST Material Measurement Laboratory houses two spectrometers, 300 MHz and 100 MHz, primarily used for

Thermogravimetric Analyzer

Thermogravimetric Analysis, or TGA, is a classic thermoanalytical measurement performed on many different types of materials. In our laboratory, it is used for

Vector Potential Photoelectron Microscope (VPPEM)

The Vector Potential Photoemission Microscope endstation sits at the end of both the SST-I and SST-II beamlines, providing both soft (0.1 keV to 2.2 keV) and

$Bruker D8 Defractometer, a general purpose X-ray diffraction system.$

X-Ray Diffractometer

The Bruker D8 defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a variety of

X-ray Photoelectron Spectroscopy

The Material Measurement Science Division at NIST performs surface chemical analysis using X-ray Photoelectron Spectroscopy (XPS) with capabilities for routine

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