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Materials

Materials characterization

Tools and Instruments

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View of the sample area in the X-ray Diffraction (XRD) end station on the Beamline for Material Measurement (BMM). 

Synchrotron X-ray Diffraction (XRD)

The X-ray diffraction (XRD) end station measures constructive interference of the x-ray wave with repeating atomic and interfacial structure in materials. At
300 MHz solid-state NMR

The Solid-State NMR Facility

The newly renovated solid-state NMR facility at the NIST Material Measurement Laboratory houses two spectrometers, 300 MHz and 100 MHz, primarily used for
TGA

Thermogravimetric Analyzer

Thermogravimetric Analysis, or TGA, is a classic thermoanalytical measurement performed on many different types of materials. In our laboratory, it is used for
Bruker D8 Defractometer, a general purpose X-ray diffraction system.

X-Ray Diffractometer

The Bruker D8 defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a variety of
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