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Tools and Instruments

Displaying 1 - 15 of 15

3D Atom Probe Tomography

The LEAP 4000X is a three-dimensional atom probe microscope which provides nano-scale surface, bulk and interfacial materials analysis of structures with atom

Continuous-wave terahertz spectrometer

The continuous-wave terahertz spectrometer makes use of two near-infrared lasers. The first laser is a fixed-frequency cw ring Ti:Saph laser operating near 840

Field Emission Electron Probe

The JEOL JXA 8500f is a thermal field emission electron microprobe capable of performing quantitative X-ray microanalysis and secondary and backscattered

Focused Ion Beam

The Nova NanoLab 600 (NNL600) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase measurements

Focused Ion Beam (Helios 650)

The Helios 650 NanoLab (HNL650) is a Focused Ion Beam Scanning Electron Microscope equipped with spectroscopic detectors to allow elemental and phase

Microcalorimeter Detector

The NIST transition edge sensor microcalorimeter is energy dispersive x-ray spectrometer capable of ~5 eV resolution over a range of energies from hundreds to

Milli X-Ray Fluorescence Spectrometer

The Eagle III Micro XRF unit is similar to a traditional XRF unit, with the primary difference being that the X-rays are focused by a polycapillary optic into a

Ozone Standard Reference Photometer

DESCRIPTION The Standard Reference Photometer (SRP) Program began in the early 1980s as collaboration between NIST and the U.S. Environmental Protection Agency

Raman facility

Raman scattering is a powerful light scattering technique used to diagnose the internal structure of molecules and crystals. In a light scattering experiment,

X-Ray Diffractometer

The Bruker D8 defractometer is a general purpose X-ray diffraction system. The instrument features easy reconfiguration of the X-ray optics for a variety of