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Much of the activity of the UV Physics Group is aimed at supporting the R&D effort by the microelectronics industry to develop Extreme Ultraviolet Lithography
Electromagnetic (EM) systems use magnetic components such as inductors, isolators, and adaptive filters, but these are currently bulky and difficult to
Our aim is to develop the metrology for quantitative measurements of magnetic properties, including properties and property distributions in multilayer systems
Advanced bonding and integration physically bring together components, devices, and materials that are produced separately. There are strong economic and
The goal of the metRology for Microsoft Excel* software project is to provide a convenient user interface using Microsoft Excel for some of the specialized
Multi-physics and data-driven models are necessary to simulate, study, and optimize metal additive manufacturing (AM) processes, such as powder bed fusion (PBF)
Multi-physics models are necessary to simulate, study, and optimize metal additive manufacturing (AM) processes, such as powder bed fusion (PBF) and directed
Our goal is to develop, advance, and demonstrate measurements that facilitate Nanoimprint Lithography (NIL) as a viable technology for the patterning of robust
Our goal is to develop measurements that quantify the shape, size, orientation, and fidelity of nanoscale patterns as a platform to quantitatively evaluate
Advances in methods, instrumentation and standards promote the development of measurement science capabilities in separation technology and physical-chemical
Resistance standards traceable to NIST provide references for measurements of current at levels from 3000 A to below 20 fA and are used to support a wide
This program aims to develop the metrology to enable quantitative understanding of, and the development of standards, in quality and reliability controls in
Part quality in additive manufacturing (AM) is highly variable due to inadequate dimensional tolerances, surface roughness, and defects, thereby limiting its
The goal of the metRology software project is to provide a set of specialized functions for statistical metrology as a package for the R software environment
As part of a multi-year interagency agreement between the Office of Standards of the Department of Homeland Security and NIST, NIST is developing measurement
The MGI Code Catalog represents an extensive collection of information about software relevant to computational materials science and materials data analysis
Microelectromechanical systems (MEMS) are integrated devices with critical applications in sensing, timing, signal processing, and biomedical diagnostics, and
Light can interact with mechanical systems in interesting and useful ways, not only probing the mechanical motion with spectacular sensitivity, but also driving
Reference materials (RMs) consisting of whole microbial cells characterized for total cell number and total DNA are needed to evaluate and compare cell counting
Increasingly, high stakes decisions impacting public health and safety are being made using microbial genomic sequencing data. For example, whole genome
There is a growing need to establish quality assurance and measurement strategies to address microbial function and emergent activities related to interspecies
Superconducting devices at very low temperatures can be used to measure very small amounts of energy. Using this effect, the Quantum Sensors Group is building
NIST and the University of Colorado have been funded since April, 2006, by DARPA to develop a microcryocooler with a volume less than about 4 cm 3 to cool a
We combine novel concepts of atomic physics and advanced technology of microfabrication processes to develop miniaturized atomic devices which leverage atoms’