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The NIST program seeks to facilitate the commercialization of the ceramics additive manufacturing via the concurrent development of: New measurement approaches
Components and devices used in a broad spectrum of technology sectors such as health care, communications, energy and electronics are manufactured from
Fundamental understanding of electron-solid interactions is key to interpreting electron microscopy images for quantitative metrology. Scanning electron
We develop first-principles-based methods for prediction of atomic arrangements and properties in advanced materials and develop tools for the prediction and
Compile and evaluate phase equilibrium data for NIST Standard Reference Database 31 (Phase Equilibria Diagrams); disseminate the data in a readily accessible
Our goal is to provide analytical tools that allow measurement and prediction of local structure to enable the development of ceramic materials for electronic
All inorganic materials contain point defects in the form of impurities, interstitials, or vacancies. Common imaging techniques fail to capture these defects
A comprehensive understanding of how current and next-generation materials impact the performance of semiconductor devices is critical to U.S. Semiconductor
This project develops and applies metrologies and standards for characterizing microstructure and dynamics in advanced functional materials of technological
Mechanical strain impacts the performance of semiconductor devices. Manufacturing processes must be carefully controlled for strain to achieve high-yield and
The aim of this project is to develop robust, quantitative measurement methods utilizing transmission electron microscopy methods for complex, nanostructured