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Material Measurement Laboratory / Materials Measurement Science Division

Materials Structure and Data Group

Projects/Programs

Displaying 1 - 12 of 12
Ceramic AM

Additive Manufacturing of Ceramics

Ongoing
Additive manufacturing (AM) is a rapidly growing suite of technologies that has been a national priority since 2012. Compared to metals and polymers AM, the commercial adaptation of ceramics AM is still in its infancy. Nevertheless, ceramics AM is actively explored for applications in aerospace
blue crystal

Crystallographic Databases

Ongoing
Impact and Customers Materials with new or improved properties are continually being developed to meet demands for increased functionality of components and devices at decreased costs. Examples of multi-million dollar industries driven by materials advances are solid-state lighting (GaN-based
Blue rectangle with green line through it. Electron Solid Interaction Illustration.

Electron-Solid Interactions

Ongoing
A measuring instrument produces a signal that depends upon the value of the measurand. The value and its uncertainty are inferred from the signal by using a model of their relationship. Erroneous models lead to erroneous inference. The accuracy of SEM (scanning electron microscopy) is limited by
pedslashfullres

Inorganic Phase Equilibrium Data

Ongoing
Every deliberate effort to develop a new material or to improve processing begins with chemical composition and the conditions (temperature, pressure) under which pure compounds and their mixtures are stable ( an equilibrium phase diagram ). In the absence of such information, materials scientists

Measurement and Prediction of Local Structure

Ongoing
Functional materials enable applications in the computer, data storage, wireless communication, and energy sectors. The properties of many of these systems are critically dependent on deviations of local atomic arrangements from the global average of the crystal. No single measurement technique can
complex oxides

Measurements of Point-Defect Chemistry in Complex Oxides

Ongoing
Project Goal: To develop magnetic resonance, x-ray absorption, electron diffraction, and electrical conductivity measurements to better characterize dilute concentrations of point defects in oxide materials and effectively correlate electro-mechanical properties to measured defect chemistry. Oxide
Integrated multi-physics simulation and validation

Multiscale Modeling and Validation of Semiconductor Materials and Devices

Ongoing
The limitations of scaling traditional CMOS (complementary metal-oxide semiconductors) designs have necessitated that the semiconductor industry consider new materials and design concepts. For wide bandgap semiconductor devices, optimization of materials and fabrication processes is needed to
USAXS animation

Multiscale structure and dynamics in advanced technological materials

Ongoing
New technologies increasingly harness materials phenomena that operate across many length-scales: e.g., in selective gas adsorption, additive manufacturing, new alloy designs, or advanced concretes. To overcome technology barriers, it is no longer sufficient just to characterize the materials
Images depicting an advanced analysis of HR-EBSD data

Strain Measurement for Semiconductor Devices and Packages

Ongoing
Strain is a critical parameter that influences both electrical and mechanical failures of devices, however, measuring strain in complex 3D geometries and vanishingly small feature sizes remains a challenge for manufacturers. Data provided by strain measurements can be used to validate computational
subnanoscale electron microscopy figure

Sub-nanoscale electron microscopy of complex nanostructures

Ongoing
The properties of advance materials are becoming ever more reliant on the ability to manipulate their chemistry and structure at very fine length scales. For example, the relevant feature sizes in state-of-the-art transistors continue to decrease, even as the complexity of the architectures employed