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Gaithersburg

Advanced Electronics Group

Develops measurement infrastructure to identify specific defects which limit the performance, reliability, and commercial potential of electronics designed to operate in extreme environments.

X-Ray Residual Stress

The diffractometer is part of the Residual Stress Program with the main purpose of measuring strains/stresses. Other possible applications are the measurement

X-Ray Reflectometer

The NCNR x-ray diffractometer is configured to allow both θ/2θ diffraction and reflectometry. Typically Cu radiation is used with minimum resolution of Δλ=0
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