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Boulder

Accurate Cure Kinetics, Stress, Mechanical Properties and Warpage

Advanced packaging involves increasingly challenging requirements for heterogeneous integration and chiplet packaging. Needs such as fine pitch interconnects (

Time-resolved Emission Microscopy for Circuit Evaluation and Failure Analysis

Time-resolved-emission microscopy (TREM) is a workhorse of semiconductor circuit evaluation. However, as transistor dimensions and power-supply voltages have

A firefighter climbs a ladder into a shipping container, while a person to their left tracks their location.

Saving Seconds, Saving Lives: NIST-Funded Challenge Crowns Winners in 3D Tracking Technology

January 9, 2024

The ability to pinpoint a first responder’s precise location inside a building can be a matter of life and death.

Inside CHIPS Metrology: Research that Accelerates Innovation

Tue, Jan 16 2024, 1:00 - 2:00pm EST

Join us for a webinar hosted by the CHIPS Metrology Program. Marla Dowell, director of the CHIPS Metrology Program, will

2024 IEEE Conference on Computational Imaging Using Synthetic Apertures (CISA)

Mon, May 20 - Thu, May 23 2024

Join us for a co-hosted event with the IEEE Signal Processing Society, the IEEE Synthetic Aperture Standards Committee

Atom Probe Tomography: Nanostructured Semiconductor Materials, Interfaces, and Devices

The semiconductor industry requires sub-nanometer, 3-dimensional quantitative elemental mapping of materials, nanoscale structures, and devices with high

Direct comparison between the NIST SRI PJVS 6000 and the NIST Traveling PJVS used for certification

NIST Researchers Installed a New Quantum Voltage Standard in Spain

December 21, 2023

NIST  delivered the first NIST Standard Reference Instrument (SRI) to Spain’s oldest calibration laboratory, the  National Institute of Aerospace Technology

2024 PSCR UAS Portfolio Workshop

Wed, Feb 7 - Thu, Feb 8 2024

The NIST Public Safety Communications Research (PSCR) Division is hosting a workshop on the management of cybersecurity

ACMD Seminar: Computational Models as Integral Product Development Tools

Christine Parrish Vice President of Technology Solutions, Compact Membrane Systems Thursday, January 11, 2024, 3:00-4:00 PM ET (1:00-2:00 PM...

NIST Releases NextG Wireless R&D Gap Analysis

December 14, 2023

As the transition from fifth-generation wireless systems (5G) to next-generation communications systems (NextG) advances, research and development (R&D)

NIST’s Ultra-small, Shape-shifting GEMS Offer an Easier and Cheaper way to improve MRI Imaging

December 20, 2023

Microscopic magnetic probes that change shape in response to their environment may greatly enhance magnetic resonance imaging (MRI). However, producing the

Overview of the kilopixel thermally coupled imager (TCI)

2023 APL Rising Stars Collection - Adam McCaughan, Bakhrom Oripov and Sae Woo Nam

The Rising Stars Collection features notable APL papers by emerging investigators. These papers were identified by the editors and Rising

Photomicrograph of the linear ion trap with integrated SNSPD

2023 APL Rising Stars Collection - Benedikt Hampel, Daniel Slichter, Dietrich Leibfried, Richard Mirin, Sae Woo Nam, Varun Verma

The Rising Stars Collection features notable APL papers by emerging investigators. These papers were identified by the editors and Rising

A line drawing of a woman's head styled like a classical carved bust

METIS

A new publication describes METIS, a Metrology Exchange to Innovate in Semiconductors We are seeking comments on the draft publication through February 16, 2024

PSCR Webinar: Privacy and Public Records: Perils and possible solutions of releasing public safety records

PSCR Webinar Privacy and Public Records Handout << Back to Webinar Series page

PSCR Webinar: Privacy and Public Records: Perils and possible solutions of releasing public safety records

Wed, Dec 6 2023, 1:00 - 2:00pm MST (3:00 - 4:00pm EST)

Public safety agencies generate and store many records that are valuable to the public. Computer-aided dispatch (CAD)

ACMD Seminar: Topological Shape and Data Analysis

Jeanie Schreiber Ph.D. Candidate, Dept. of Mathematical Sciences, George Mason University Tuesday, January 23, 2024, 3:00-4:00 PM ET (1:00-2...

Application Tips

Tips for Applying to NIST Jobs These tips were developed as a guide for applicants to help clarify the application process and assist with...

Magnetic Sensing and Metrology

The Magnetic Sensing and Metrology Program characterizes a wide variety of magnetic sensors used in biomedical, industrial, electronics, environmental

2024 IEEE-RAS Response Robotics Seasonal School and Workshop

When March 4-7, 2024 Where Reveille Proving Grounds in Burnet, Texas The 2024 IEEE-RAS Response Robotics Seasonal School and Workshop (RRSS...

PSCR UAS Working Group

Cybersecurity and AI Risk Management for Uncrewed Aircraft Systems (UAS) in Public Safety Call for Working Group Participants Learn More...

NIST Updates Guide on Communications Standards to Federal Agencies

November 1, 2023

NIST released an updated version of its Interagency Report on Advanced Communication Technologies Standards which is a guide for Federal agencies on standards

ACMD Seminar: The Countoscope: measuring self and collective diffusion with fancy counting

Brennan Sprinkle Assistant Professor, Applied Math & Stats. Dept., Colorado School of Mines Tuesday, November 28, 2023, 3:00-4:00 PM ET (1...

Marla Dowell Recognized as a Distinguished Executive with 2023 Presidential Rank Award

On November 3, 2023, Marla Dowell, Director of CHIPS R&D Metrology and NIST Boulder Laboratory, was recognized by the President of the

Balancing Knowledge and Governance: Foundations for Effective Risk Management of Artificial Intelligence

October 18, 2023

Referenced Speaker

Elham Tabassi

Chairman Obernolte, Chairman Collins, Ranking Members Foushee and Stevens and members of the subcommittees, I am Elham Tabassi, Associate Director for Emerging...

Boulder

Accurate Cure Kinetics, Stress, Mechanical Properties and Warpage

Time-resolved Emission Microscopy for Circuit Evaluation and Failure Analysis

Saving Seconds, Saving Lives: NIST-Funded Challenge Crowns Winners in 3D Tracking Technology

Inside CHIPS Metrology: Research that Accelerates Innovation

2024 IEEE Conference on Computational Imaging Using Synthetic Apertures (CISA)

Atom Probe Tomography: Nanostructured Semiconductor Materials, Interfaces, and Devices

NIST Researchers Installed a New Quantum Voltage Standard in Spain

2024 PSCR UAS Portfolio Workshop

ACMD Seminar: Computational Models as Integral Product Development Tools

NIST Releases NextG Wireless R&D Gap Analysis

NIST’s Ultra-small, Shape-shifting GEMS Offer an Easier and Cheaper way to improve MRI Imaging

2023 APL Rising Stars Collection - Adam McCaughan, Bakhrom Oripov and Sae Woo Nam

2023 APL Rising Stars Collection - Benedikt Hampel, Daniel Slichter, Dietrich Leibfried, Richard Mirin, Sae Woo Nam, Varun Verma

METIS

PSCR Webinar: Privacy and Public Records: Perils and possible solutions of releasing public safety records

PSCR Webinar: Privacy and Public Records: Perils and possible solutions of releasing public safety records

ACMD Seminar: Topological Shape and Data Analysis

Application Tips

Magnetic Sensing and Metrology

2024 IEEE-RAS Response Robotics Seasonal School and Workshop

PSCR UAS Working Group

NIST Updates Guide on Communications Standards to Federal Agencies

ACMD Seminar: The Countoscope: measuring self and collective diffusion with fancy counting

Marla Dowell Recognized as a Distinguished Executive with 2023 Presidential Rank Award

Balancing Knowledge and Governance: Foundations for Effective Risk Management of Artificial Intelligence

NIST Team Develops Highest-Resolution Single-Photon Superconducting Camera

ACMD Seminar: Applications in Machine Learning for Structure Elucidation

IEEE ICC 2024 The 3rd Workshop on Spectrum Sharing Technology for Next Generation Communications

ACMD Seminar & Demos: Immersive ParaView

Advancing Indoor Safety for First Responders: UAS 4.0 Indoor Challenge