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Search Publications by: Takehiko Oe (IntlAssoc)

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Evaluation of NMIJ Traveling Dual Source Bridge Using NIST Adapted Wheatstone Bridge

August 24, 2020
Author(s)
Takehiko Oe, Shamith U. Payagala, Dean G. Jarrett, Nobu-Hisa Kaneko
DC high resistance measurement capability has been evaluated using a NMIJ traveling dual source bridge between NIST and NMIJ. The NMIJ bridge determines the resistance ratio by measuring the voltage ratio using a digital multimeter, 3458A. Based on the
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