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Comparison between NIST Graphene and AIST GaAs Quantized Hall Devices

Published

Author(s)

Takehiko Oe, Albert Rigosi, Mattias Kruskopf, Bi Y. Wu, Hsin Y. Lee, Yanfei Yang, Randolph Elmquist, Nobu-hisa Kaneko, Dean G. Jarrett
Citation
IEEE Transactions on Instrumentation and Measurement

Citation

Oe, T. , Rigosi, A. , Kruskopf, M. , Wu, B. , Lee, H. , Yang, Y. , Elmquist, R. , Kaneko, N. and Jarrett, D. (2019), Comparison between NIST Graphene and AIST GaAs Quantized Hall Devices, IEEE Transactions on Instrumentation and Measurement, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927932 (Accessed June 19, 2024)

Issues

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Created July 24, 2019, Updated October 12, 2021