TY  - JOUR
AU  - Takehiko Oe
AU  - Albert Rigosi
AU  - Mattias Kruskopf
AU  - Bi Wu
AU  - Hsin Lee
AU  - Yanfei Yang
AU  - Randolph Elmquist
AU  - Nobu-hisa Kaneko
AU  - Dean Jarrett
C2  - IEEE Transactions on Instrumentation and Measurement
DA  - 2019-07-25 00:07:00
LA  - en
PB  - IEEE Transactions on Instrumentation and Measurement
PY  - 2019
TI  - Comparison between NIST Graphene and AIST GaAs Quantized Hall Devices
UR  - https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=927932
ER  -