July 24, 2024
      
                  
        
  Author(s)
  Frederick  Meisenkothen,   David  Newton,   Karen  DeRocher,   Mark  McLean
 
       
            
    
    
        Atom probe tomography (APT) is emerging as an essential characterization tool in a wide variety of science and engineering fields. For example, APT is helping to foster nascent fields, such as nano-geology [1], and is increasingly being adopted by the