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Search Publications by Yicheng Wang

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Displaying 1 - 25 of 63

Graphene quantum Hall effect devices for AC and DC resistance metrology

Mattias Kruskopf, Dinesh K. Patel, Chieh-I Liu, Albert F. Rigosi, Randolph E. Elmquist, Yicheng Wang, Stefan Bauer, Yefei Yin, Klaus Pierz, Eckard Pesel, Martin Goetz, Jurgen Schurr
The frequency dependence of the quantized Hall resistance at alternating current results from capacitive losses inside the sample as well as between the sample

Alignment and testing of the NIST Calculable Capacitor

Yicheng Wang, Felipe Guzman, Corey A. Stambaugh, Radek Smid, Hugo Zuniga Calvo, Andrew D. Koffman, Jon R. Pratt, John R. Lawall
This paper reports progress on the NIST effort to develop a new calculable capacitor, focusing on improvement of the guard electrode motion control as well as

Eddy Current Rail Inspection Using AC Bridge Techniques

Andrew D. Koffman, Bryan C. Waltrip, Yicheng Wang
AC bridge techniques commonly used for precision impedance measurements have been adopted to develop an eddy current sensor for rail defect detection. By using

Advanced Capacitance Metrology for Nanoelectronic Device Characterization

Curt A. Richter, Joseph J. Kopanski, Yicheng Wang, Muhammad Y. Afridi, Xiaoxiao Zhu, D. E. Ioannou, Qiliang Li, Chong Jiang
We designed and fabricated a test chip (consisting of an array of metal-oxide-semiconductor (MOS) capacitors and metal-insulator-metal (MIM) capacitors ranging

AC Power Standard Using a Programmable Josephson Voltage Standard

Bryan C. Waltrip, Bo Gong, Thomas L. Nelson, Yicheng Wang, Charles J. Burroughs, Alain Rufenacht, Samuel P. Benz, Paul D. Dresselhaus
This paper describes the implementation of a new quantum-based system for the generation of 120 V rms, 5 A rms, sinusoidal, active and reactive power over the

Evaluation of a Capacitance Scaling System

Svetlana Avramov-Zamurovic, Andrew D. Koffman, Bryan C. Waltrip, Yicheng Wang
A capacitance scaling system from 10 nF to 100 mF [1], [2] has been implemented at the National Institute of Standards and Technology (NIST). Standard four

A digitally programmable capacitance standard

Yicheng Wang, Lai H. Lee
We constructed a digitally programmable capacitance standard by modifying a commercial temperature-stabilized 100 pF capacitance standard which consists of 23

Frequency dependence of capacitance standards

Yicheng Wang
We measured the frequency dependence of a 10 pF transportable fused-silica capacitor from 50 Hz to 20 kHz. The results have a relative standard uncertainty of 0

Electron Drift in C4F6 and C4F6/Ar Mixtures

Amanda N. Goyettes, Yicheng Wang, Gerald J. FitzPatrick
We report measurements of electron drift velocities as a function of density-reduced electric field, w(E/N), for hexafluorobutadiene (C4F6) and mixtures of C4F6

Rate Constants for Unimolecular Decomposition of SF6-

Yicheng Wang, R. Champion, I. V. Dyakov, B. Peko
Insulating gas mixtures containing SF6 have been promoted to serve as replacements for pure SF6 in order to reduce SF6 atmospheric emission. It has been argued