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Search Publications by: Eric S Windsor (Fed)

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Displaying 1 - 22 of 22

Rapid chemical screening of microplastics and nanoplastics by thermal desorption and pyrolysis mass spectrometry with unsupervised fuzzy clustering

August 11, 2023
Author(s)
Thomas P. Forbes, John Pettibone, Eric S. Windsor, Joseph M. Conny, Robert A. Fletcher
The transport and chemical identification of microplastics and nanoplastics (MNPs) are critical to the concerns over plastic accumulation in the environment. Chemically and physically transient MNP species present unique challenges for isolation and

Characterization of Chemical Properties, Unit Cell Parameters and Particle Size Distribution of Three Zeolite Reference Materials: RM 8850 - Zeolite Y, RM 8851 - Linde Type A Zeolite and RM 8852 - Ammonium ZSM-5 Zeolite

April 4, 2017
Author(s)
Shirley Turner, Robert A. Fletcher, Eric S. Windsor, Jennifer R. Verkouteren, John R. Sieber, Thomas W. Vetter, Rolf L. Zeisler, Anthony F. Marlow, M E. Davis, G J. Kennedy, W S. Borghard, S Yang, A Navrotsky, B H. Toby, James F. Kelly, Stefan D. Leigh
Zeolites have important industrial applications including use as catalysts, molecular sieves and ion exchange materials. In this study, three zeolite materials have been characterized by the National Institute of Standards and Technology (NIST) as

Particle Fabrication Using Inkjet Printing onto Hydrophobic Surfaces for Optimization and Calibration of Trace Contraband Detection Sensors

November 24, 2015
Author(s)
John G. Gillen, Marcela N. Najarro, Matthew E. Staymates, Scott A. Wight, Marlon L. Walker, Jennifer R. Verkouteren, Eric S. Windsor, Aaron A. Urbas
A method has been developed to fabricate patterned arrays of micrometer-sized monodisperse solid particles of ammonium nitrate on hydrophobic silicon surfaces using inkjet printing. The method relies on dispensing one or more microdrops (typically 50 pL

Application of Inkjet Printing Technology to Produce Test Materials of 1,3,5-Trinitro-1,3,5 Triazcyclohexane for Trace Explosive Analysis

October 15, 2010
Author(s)
Eric S. Windsor, Marcela N. Najarro, Anna N. Bloom, Bruce A. Benner Jr, Robert A. Fletcher, John G. Gillen, Richard Lareau, Inho Cho, Mike Boldmand
The feasibility of using piezoelectric drop-on-demand inkjet printing to prepare test materials for trace explosive analysis is demonstrated. Both pure high explosives and plastic-bonded putty explosives were formulated into inkjet printable solutions and

Trace Explosive Detection Standards Using Drop-on-Demand Inkjet Printing Technology

October 16, 2008
Author(s)
Eric S. Windsor, Bruce A. Benner Jr., Robert A. Fletcher, J Greg Gillen, R Lareau, Inho Cho, Mike Boldmand
A piezoelectric drop-on-demand inkjet printer system has been used to prepare prototype trace explosive calibration materials to aid in the performance evaluation of ion mobility spectrometry instruments that are now widely deployed in support of homeland

NIST Program to Support Testing and Evaluation of Trace Explosive Detection

October 1, 2007
Author(s)
R M. Verkouteren, John G. Gillen, Jennifer R. Verkouteren, Robert A. Fletcher, Eric S. Windsor, Wayne Smith
Trace detection is a primary strategy for thwarting terrorism activities in the US and abroad. The development of effective reference materials and methods for this purpose relies on fundamental knowledge regarding the size, mass, morphologies, and

Inkjet Metrology and Standards for Ion Mobility Spectrometry

September 1, 2007
Author(s)
R M. Verkouteren, J Brazin, Eric S. Windsor, Robert A. Fletcher, R Maditz, Wayne Smith, John G. Gillen
Piezoelectric inkjet nozzles offer precise control for dispensing small quantities of materials. NIST is developing inkjet metrology to provide reference materials, calibration services, and other standards for the IMS detection of trace contraband

Depth Profiling Using C 60 + SIMS Deposition and Topography Development During Bombardment of Silicon

July 30, 2006
Author(s)
John G. Gillen, J Batteas, Chris A. Michaels, P Chi, John A. Small, Eric S. Windsor, Albert J. Fahey, Jennifer R. Verkouteren, W Kim
A C60+ primary ion source has been coupled to an ion microscope SIMS instrument to examine sputtering of silicon with an emphasis on possible application of C60+ depth profiling for high depth resolution SIMS analysis of silicon semiconductor materials

Bevel Depth Profiling SIMS for Analysis of Layer Structures

September 1, 2003
Author(s)
John G. Gillen, Scott A. Wight, P Chi, Albert J. Fahey, Jennifer R. Verkouteren, Eric S. Windsor, D. B. Fenner
We are evaluating the use of bevel depth profiling Secondary Ion Mass Spectrometry (SIMS) for the characterization of layered semiconductor materials. In this procedure, a sub-degree angle bevel is cut into the analytical sample with an oxygen or cesium

Copper Oxide Precipitates in NBS Standard Reference Material 482

December 1, 2002
Author(s)
Eric S. Windsor, R Carlton, John G. Gillen, Scott A. Wight, David S. Bright
Copper oxide has been detected in the copper containing alloys of Standard Reference Material (SRM) 482. This occurrence is significant because it represents heterogeneity within a standard reference material that was certified to be homogeneous on a

Analysis of Kaolinite/Chrysotile Mixtures by Ashing and X-Ray Diffraction

September 1, 2002
Author(s)
Jennifer R. Verkouteren, Eric S. Windsor, Joseph M. Conny, R L. Perkins, J T. Ennis
A simple ashing procedure is described that converts kaolinite to amorphous metakaolinite while retaining the diffraction intensity of chrysotile. This ashing procedure removes the XRD pattern overlap between kaolinite and chrysotile that can interfere

SRM 482 Revisited After 30 Years

August 1, 2001
Author(s)
Eric S. Windsor, R Carlton, Scott A. Wight, C Lyman
The National Institute of Standards and Technology's (NIST) Standard Reference Material (SRM) 482 was issued by The National Bureau of Standards (NBS) in 1969 and has been continuously available to the public for over 30 years [1]. The standard consists of

Gate Dielectric Thickness Metrology Using Transmission Electron Microscopy

January 1, 2000
Author(s)
J H. Scott, Eric S. Windsor, D Brady, J Canterbury, A. Karamcheti, W Chism, A C. Diebold
Silicon Oxynitride blanket films approximately 2 n min thickness are characterized in cross section using a 300 keV TEM/STEM. High resolution imaging is used to investigate the accuracy and precision of TEM film thickness measurements and their

SRM 2806 (ISO Medium Test Dust in Hydraulic Oil): A Particle-Contamination Standard Reference Material for the Fluid Power Industry

August 1, 1999
Author(s)
Robert A. Fletcher, Jennifer R. Verkouteren, Eric S. Windsor, David S. Bright, Eric B. Steel, John A. Small, Walter S. Liggett Jr
Standard Reference material (SRM) 2806 is composed of ISO medium test dust (ISO 12103-A3), a mineral dust, suspended in MIL-H-5606 hydraulic oil. SRM 2806 is a traceable particle count standard and is certified for number of particles larger than a

Boron Substrates for the X-Ray Microanalysis of Particles

January 1, 1999
Author(s)
Eric S. Windsor, Dale E. Newbury, J Kessler
Boron is available commercially as high purity (> 0.995) crystalline pieces. Using metallographic sample preparation techniques, these crystalline pieces can be prepared to form substrates that are useful for the x-ray microanalysis of particles. Boron is