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Displaying 26 - 50 of 78

Pressure-Sensitive Sampling Wands for Homeland Security Applications

December 1, 2013
Author(s)
Matthew E. Staymates, Jennifer R. Verkouteren, Jessica Grandner
This work discusses the use of Force Sensing Resistor (FSR) technology for Homeland Security applications. One area of particular focus is the optimization of wipe sampling of surfaces to facilitate enhanced trace contraband collection. Another focus area

Automated Mapping of Explosives Particles in Composition C-4 Fingerprints

March 1, 2010
Author(s)
Jennifer R. Verkouteren, Jessica L. Staymates, Inho Cho
A method is described to perform automated mapping of RDX particles in C-4 fingerprints. The method employs polarized light microscopy and image analysis to map the entire fingerprint and the distribution of RDX particles. The approach is relatively quick

Metrology in Support of Trace Explosive Detection Equipment for Airport Security Applications.

October 16, 2008
Author(s)
George A. Klouda, J Greg Gillen, Robert A. Fletcher, E S. Etz, Jennifer R. Verkouteren, R. Michael Verkouteren, E Ferguson
We are working in collaboration with the Transportation Security Agency's Trace Explosive Detection Group to build a chemical metrology program to help support the widespread operational deployment and effective utilization of trace explosives detection

Optical Properties of Amphibole Asbestos

October 16, 2008
Author(s)
Jennifer R. Verkouteren, A G. Wylie
The fibrillar growth habit and 100} twinning may produce anomalous optical properties in fibrous amphiboles. The optical properties of 16 fibrous tremolite, actinolite, and ferro-actinolite samples from Verkouteren and Wylie (2000) are described. One

Particle Characteristics of Trace High Explosives: RDX and PETN

October 16, 2008
Author(s)
Jennifer R. Verkouteren
The sizes of explosives particles in fingerprint residues produced from C-4 and Semtex-1A were investigated with respect to a fragmentation model. Particles produced by crushing RDX and PETN were sized by using scanning electron microscopy combined with

XRD Rietveld Simulations Y 2 O 3 - ZrO 2 Phases

October 16, 2008
Author(s)
Jennifer R. Verkouteren, Joseph M. Conny
X-ray diffraction patterns of tetragonal and cubic yttria-stabilized were simulated to test the capability of Rietveld refinement to accurately seperate the phases. The effects of peak broadening and different c/a ratios on the refinement results were

Method to Determine Collection Efficiency of Particles by Swipe Sampling

September 1, 2008
Author(s)
Jennifer R. Verkouteren, Jessica L. Staymates, Robert A. Fletcher, Wayne Smith, George A. Klouda, John G. Gillen
A methodology was developed to evaluate particle collection efficiencies from swipe sampling of trace residues. Swipe sampling is used for many applications where trace residues must be collected, including the evaluation of radioactive particle

NIST Program to Support Testing and Evaluation of Trace Explosive Detection

October 1, 2007
Author(s)
R M. Verkouteren, John G. Gillen, Jennifer R. Verkouteren, Robert A. Fletcher, Eric S. Windsor, Wayne Smith
Trace detection is a primary strategy for thwarting terrorism activities in the US and abroad. The development of effective reference materials and methods for this purpose relies on fundamental knowledge regarding the size, mass, morphologies, and