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Search Publications by: Mark D. Stiles (Fed)

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Displaying 301 - 325 of 383

Exchange Bias Relaxation in CoO-Biased Films

January 1, 1999
Author(s)
Robert McMichael, C Lee, Mark D. Stiles, F Serpa, P J. Chen, William F. Egelhoff Jr.
Because the memory of the bias direction is carried by the antiferromagnetic order in exchange biased films, the stability of the antiferromagnetic order is critical to the existence of the exchange bias field. Ferromagnetic resonance was used to measure

Magnetic Reversal on Vicinal Surfaces

January 1, 1999
Author(s)
R Hyman, A Zangwill, Mark D. Stiles
We present a theoretical study of in-plane magnetization reversal for vicinal ultrathin films using a one-dimensional micromagnetic model with nearest-neighbor exchange, fourfold anisotropy at all sites, and two-fold anisotropy at step edges. A detailed

Ferromagnetic Resonance Studies of NiO-Coupled Thin Films of Ni 80 Fe 20

October 1, 1998
Author(s)
Robert D. McMichael, Mark D. Stiles, P J. Chen, William F. Egelhoff Jr.
This paper describes ferromagnetic resonance (FMR) and magnetoresistive measurements of thin magnetic films coupled to antiferromagnetic films. First, FMR results for films of Ni 80Fe 20 show that coupling to NiO produces the angular variation in the

Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO

June 1, 1998
Author(s)
Robert D. McMichael, Mark D. Stiles, P J. Chen, William F. Egelhoff Jr.
The out-of-plane angular dependence of the ferromagnetic resonance linewidth, [Δ] H, has been measured for thin magnetic films coupled to NiO and for uncoupled control films. In the control films, [Δ] is described by nearly angle-independent damping

Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO

January 1, 1998
Author(s)
Robert McMichael, Mark D. Stiles, P J. Chen, William F. Egelhoff Jr.
The out-of-plane angular dependence of the ferromagnetic resonance linewidth, Δ H is described by nearly angle-independent damping parameters. In the NiO-coupled films, however, the damping was found to depend strongly on magnetization orientation, with

Ferromagnetic Resonance Studies of NiO-coupled Thin Films of Ni 80 Fe 20

January 1, 1998
Author(s)
Robert McMichael, Mark D. Stiles, P J. Chen, William F. Egelhoff Jr.
This paper describes ferromagnetic resonance (FMR) and magnetoresistive measurements of thin magnetic films coupled to antiferromagnetic films. First, FMR results for films of Ni 80Fe^d20 show that coupling to NiO produces the angular variation in the

Oxygen as a Surfactant in the Growth of Giant Magnetoresistance Spin Valves

January 1, 1998
Author(s)
P J. Chen, Cedric J. Powell, Mark D. Stiles, Robert McMichael, J Judy, K Takano, A Berkowitz
We have found a novel method for increasing the giant magnetoresistance (GMR) of Co/Cu spin valves with the use of oxygen. Surprisingly, spin valves with the largest GMR are not produced in the best vacuum. Introducing 5x10 -9 Torr (7x10 -7 Pa) into our

Oxygen as a Surfactant in the Growth of Giant Magnetoresistance Spin Valves

December 1, 1997
Author(s)
William F. Egelhoff Jr., P J. Chen, Cedric J. Powell, Mark D. Stiles, Robert McMichael, J Judy, K Takano, A. E. Berkowitz
We have found a novel method for increasing the giant Magnetoresistance (GMR) of Co/Cu spin valves with the use of oxygen. Surprisingly, spin valves with the largest GMR are not produced in the best vacuum. Introducing 5X10 -9 Torr (7X10 -7 Pa) into our

Coercivity of Ultrathin Films with In-plane Magnetization

April 15, 1997
Author(s)
R Hyman, Mark D. Stiles, L Tang, A Zangwill
We report numerical and analytic results for a model of coercivity and magnetization reversal in an array of square monolayer-height magnetic islands on a monolayer of magnetic material with in-plane magnetization. Reversal nucleates at step edges where

Generalized Slater-Koster Method for Fitting Band Structures

January 1, 1997
Author(s)
Mark D. Stiles
A tight-binding procedure is presented for fitting electronic band structures of crystals. It is based on a fully automated method of determining all possible independent matrix elements for arbitrary crystal structures. A fit, using this method, for the