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PUBLICATIONS

Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO

Published

Author(s)

Robert D. McMichael, Mark D. Stiles, P J. Chen, William F. Egelhoff Jr.

Abstract

The out-of-plane angular dependence of the ferromagnetic resonance linewidth, [Δ] H, has been measured for thin magnetic films coupled to NiO and for uncoupled control films. In the control films, [Δ] is described by nearly angle-independent damping parameters. In the NiO-coupled films, however, the damping was found to depend strongly on magnetization orientation, with linewidth values comparable to the control samples at normal orientation, but several times larger when the magnetization lies in plane. The additional linewidth in the NiO-coupled films follows the angular dependence of the number of nearly degenerate spin wave modes, in agreement with the predictions of a two-magnon scattering model of damping which incorporates a spin wave dispersion relation suitable for ultrathin films.
Citation
Journal of Applied Physics
Volume
83
Issue
No. 11
Pub Type
Journals

Keywords

magnetic films, parameters spin wave modes, ultra-thin films

Citation

McMichael, R. , Stiles, M. , Chen, P. and Egelhoff, W. (1998), Ferromagnetic Resonance Linewidth in Thin Films Coupled to NiO, Journal of Applied Physics (Accessed October 15, 2025)

Issues

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Created June 1, 1998, Updated February 19, 2025
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