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Search Publications by: Charles F. Majkrzak (Fed)

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Displaying 76 - 100 of 109

Structural Evidence for an Edge-Contaminated Vortex Phase in a Nb Crystal using Neutron Diffrraction

July 20, 2011
Author(s)
Helen A. Hanson, X. Wang, I. K. Dimitrov, J. Shi, X. S. Ling, Brian B. Maranville, Charles Majkrzak, M. Laver, U. Keiderling, M. Russina
We report the structural observation of a disordered vortex matter phase existing near the edge of a bulk type-II superconductor Nb using a novel position-sensitive neutron diffraction technique. This "edge-contaminated" vortex state was implicated in

Variations in Cross-link Density with Deposition Pressure in Ultrathin Plasma Polymerized Benzene and Octafluorocyclobutane Films

September 1, 2010
Author(s)
Someswara R. Peri, Brian Habersberger, Bulent Akgun, Hao Jiang, Jesse Enlow, Timothy J. Bunning, Charles Majkrzak, Mark D. Foster
For ultrathin, plasma polymerized (PP) films, variations in structure with depth near the substrate and near the surface are much more readily apparent than in thick films. Neutron reflectometry (NR) measurements of ultrathin PP-films from

Abstracts for the MSEL Assessment Panel, March 2001

January 26, 2001
Author(s)
Leslie E. Smith, Alamgir Karim, Leonid A. Bendersky, C Lu, J J. Scott, Ichiro Takeuchi, Kathleen M. Flynn, Vinod K. Tewary, Davor Balzar, G A. Alers, Stephen E. Russek, Charles C. Han, Haonan Wang, William E. Wallace, Daniel A. Fischer, K Efimenko, Wen-Li Wu, Jan Genzer, Joseph C. Woicik, Thomas H. Gnaeupel-Herold, Henry J. Prask, Charles F. Majkrzak, Norman F. Berk, John G. Barker, Charles J. Glinka, Eric K. Lin, Ward L. Johnson, Paul R. Heyliger, David T. Read, R R. Keller, J Blendell, Grady S. White, Lin-Sien H. Lum, Eric J. Cockayne, Igor Levin, C E. Johnson, Maureen E. Williams, Gery R. Stafford, William J. Boettinger, Kil-Won Moon, Daniel Josell, Daniel Wheeler, Thomas P. Moffat, W H. Huber, Lee J. Richter, Clayton S. Yang, Robert D. Shull, R A. Fry, Robert D. McMichael, William F. Egelhoff Jr., Ursula R. Kattner, James A. Warren, Jonathan E. Guyer, Steven P. Mates, Stephen D. Ridder, Frank S. Biancaniello, D Basak, Jon C. Geist, Kalman D. Migler
Abstracts relating to research and development in the NIST Materials Science and Engineering Laboratory (MSEL) are presented for a poster session to be presented to the 2001 MSEL Assessment Panel.

Magnetic Depth Profiling Co/Cu Multilayers to Investigate Magnetoresistance

May 1, 2000
Author(s)
John Unguris, D Tulchinsky, Michael H. Kelley, Julie A. Borchers, Joseph A. Dura, Charles F. Majkrzak, S. Y. Hsu, R Loloee, W Pratt, J Bass
The magnetic microstructure responsible for the metastable high resistance state of weakly coupled, as-prepared [Co(6nm)/Cu(6nm)] 20 multilayer was analyzed using polarized neutron reflectivity (PNR) and scanning electron microscopy with polarization