Phase-Sensitive Neutron Reflectometry Measurements Applied in the Study of Photovoltaic Films

Published

August 20, 2010

Author(s)

Jonathan W. Kiel, M.E. Mackay, Brian Kirby, Brian B. Maranville, Charles Majkrzak

Abstract

Due to low charge carrier mobilities in polymer based solar cells, device performance is dictated by the nanoscale morphology of the active layer components. However, their morphological details are notoriously difficult to distinguish due to the low electron contrast difference between the components. Phase Sensitive Neutron Reflectivity (PSNR) is uniquely suited to characterize these systems due to the large, natural scattering length density difference between two common device materials, poly (3-hexylthiophene) (P3HT) and [6,6]-phenyl-C61-butyric acid methyl ester (PCBM). Using PSNR we find a high concentration of PCBM at the substrate and near but not at the air interface. Herein we discuss the method of applying PSNR to polymer based solar cells, the results obtained and an evaluation of its effectiveness.

Citation

Journal of Chemical Physics

Volume

133

Issue

7

Pub Type

Journals

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Keywords

polymers, photovoltaics, neutron reflectometry

Citation

Kiel, J. , Mackay, M. , Kirby, B. , Maranville, B. and Majkrzak, C. (2010), Phase-Sensitive Neutron Reflectometry Measurements Applied in the Study of Photovoltaic Films, Journal of Chemical Physics, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=905769 (Accessed October 11, 2025)