Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Composition Profiling in a Binary Polymer Blend Thin Film Using Polarized Neutron Reflectivity

Published

Author(s)

H Grull, A Schreyer, Norman F. Berk, Charles Majkrzak, Charles C. Han

Abstract

The concentration profile in an ultra-thin film (film thickness d=440 ) of a high molecular mass poly(isoprene)/deuterated poly(butadiene) blend is measured in the bulk system=s miscible region with a new polarized neutron reflectivity method. By using a buried ferromagnetic layer inside the wafer and a polarized neutron beam, it is possible to obtain the phase angle of the complex neutron specular reflection intensity. A model independent and unambiguous profile of the film potential can be obtained by fitting the reflection amplitude. The scattering length density profile thus obtained reveals poly(isoprene) segregating symmetrically to the polymer/air and polymer/Si interfaces. The adsorption profile at both interfaces can be approximately described using an exponential- or tanh-function with a decay constant smaller than the bulk correlation length.
Citation
Europhysics Letters
Volume
50
Issue
No. 1

Keywords

neutron reflectivity, polymer blend, solid-fluid interface, thermodynamics of surfaces and interface, thin film, wetting adsorption

Citation

Grull, H. , Schreyer, A. , Berk, N. , Majkrzak, C. and Han, C. (2000), Composition Profiling in a Binary Polymer Blend Thin Film Using Polarized Neutron Reflectivity, Europhysics Letters, [online], https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=851608 (Accessed April 18, 2024)
Created March 31, 2000, Updated October 12, 2021