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Search Publications by: Charles F. Majkrzak (Fed)

Displaying 101 - 109 of 109

Using Polarized Neutrons to Determine the Phase of Reflection From Thin Film Structures

January 1, 1999

Author(s)

A Schreyer, Charles F. Majkrzak, Norman F. Berk, H Grull, Charles C. Han

Neutron Reflectometry, X-Ray Reflectometry, and Spectroscopic Ellipsometry Characterization of Thin SiO 2 on Si

October 12, 1998

Author(s)

Joseph Dura, Curt A. Richter, Charles Majkrzak, Nhan Van Nguyen

Characterization of Thin SiO 2 on Si by Spectroscopic Ellipsometry, Neutron Reflectometry, and X-Ray Reflectometry

July 1, 1998

Author(s)

Curt A. Richter, Nhan Van Nguyen, Joseph Dura, Charles Majkrzak

We compare the results of neutron reflectometry, x-ray reflectometry, and spectroscopic ellipsometry measurements of a thin oxide film (=10 nm). These methods, which arise from three physically different scattering mechanisms, each determine physical

Observation of antiparallel magnetic order in weakly coupled Co/Cu multilayers

May 23, 1998

Author(s)

Julie Borchers, Joseph Dura, John Unguris, D Tulchinsky, Michael H. Kelley, Charles Majkrzak, S. Y. Hsu, R Loloee, W Pratt, J Bass

Polarized neutron reflectivity and scanning electron microscopy with polarization analysis are combined to determine the magnetic structure of Co(6 nm)/Cu(6 nm) multilayers. These data resolve a controversy regarding the low-field state of giant

Hybrid Bilayer Membranes in Air and Water: Infrared Spectroscopy and Neutron Reflectivity Studies

March 1, 1998

Author(s)

Curtis W. Meuse, S. Krueger, Charles F. Majkrzak, Joseph A. Dura, Jing Fu, J. T. Connor, Anne L. Plant