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Search Publications by Dean G. Jarrett

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Displaying 1 - 25 of 75

The Next Generation of Current Measurement for Ionization Chambers

Author(s)
Ryan P. Fitzgerald, Denis E. Bergeron, Dean G. Jarrett, Neil M. Zimmerman, Carine Michotte, Hansjoerg Scherer, Stephen Giblin, Steven Judge
Re-entrant ionization chambers (ICs) are essential to radionuclide metrology and nuclear medicine for maintaining standards and measuring half-lives. Metrology

AC and DC Quantized Hall Array Resistance Standards

Author(s)
Randolph E. Elmquist, Mattias Kruskopf, Dinesh K. Patel, I Fan Hu, Chieh-I Liu, Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, Dean G. Jarrett
Quantized Hall array resistance standards (QHARS) span values from 100 (ohm) to 1 M(ohm) and demonstrate precision approaching that of single devices. This

Ohms Law Low-current Calibration System for Ionization Chambers

Author(s)
Dean G. Jarrett, Shamith U. Payagala, Ryan P. Fitzgerald, Denis E. Bergeron, Jeffrey T. Cessna, Charles J. Waduwarage Perera, Neil M. Zimmerman
A system for the calibration of electrometers that measure currents from ionization chambers is described. The calibration system uses a 1 GΩ standard resistor

Advanced Temperature-Control Chamber for Resistance Standards

Author(s)
Shamith U. Payagala, Alireza R. Panna, Albert F. Rigosi, Dean G. Jarrett
Calibration services for resistance metrology have continued to advance their capabilities and establish new and improved methods for maintaining standard

10 T? and 100 T? Resistance Comparison between NIST and AIST

Author(s)
Dean G. Jarrett, Takehiko Oe, Nobu Kaneko, Shamith U. Payagala
We report the results of a comparison of 10 TΩ and 100 TΩ high resistance standards between the National Institute of Standards and Technology (NIST) and the

Epitaxial Graphene p-n Junctions

Author(s)
Jiuning Hu, Mattias Kruskopf, Yanfei Yang, Bi Y. Wu, Jifa Tian, Alireza R. Panna, Albert F. Rigosi, Hsin Y. Lee, George R. Jones Jr., Marlin E. Kraft, Dean G. Jarrett, Kenji Watanabe, Takashi Taniguchi, Randolph E. Elmquist, David B. Newell
We report the fabrication and measurement of top gated epitaxial graphene p-n junctions where exfoliated hexgonal boron nitride (hBN) is used as the gate

Uncertainty of the Ohm Using Cryogenic and Non-Cryogenic Bridges

Author(s)
Alireza R. Panna, Marlin E. Kraft, Albert F. Rigosi, George R. Jones Jr., Shamith U. Payagala, Mattias Kruskopf, Dean G. Jarrett, Randolph E. Elmquist
We describe recent scaling measurements to decade resistance levels based on both cryogenic and non-cryogenic current comparator bridges. National measurement

A Table-Top Graphene Quantized Hall Standard

Author(s)
Albert F. Rigosi, Alireza R. Panna, Shamith U. Payagala, George R. Jones Jr., Marlin E. Kraft, Mattias Kruskopf, Bi Y. Wu, Hsin Y. Lee, Yanfei Yang, Dean G. Jarrett, Randolph E. Elmquist, David B. Newell
We report the performance of a quantum standard based on epitaxial graphene maintained in a 5 T table-top cryocooler system. The ν = 2 resistance plateau, with

Fabrication of High Value Standard Resistors for ICE-LMVE

Author(s)
Dean G. Jarrett, Isabel Castro, Marlin E. Kraft
In Costa Rica, the Laboratorio Metrológico de Variables Eléctricas (LMVE) at the Instituto Costarricense de Electricidad (ICE) develops and improves measurement

Quantum Hall Resistance Traceability for the NIST-4 Watt Balance

Author(s)
Dean G. Jarrett, Randolph E. Elmquist, Marlin E. Kraft, George R. Jones, Shamith Payagala, Frank Seifert, Stephan Schlamminger, Darine El Haddad
Scaling from the quantum Hall resistance to 100 Ω standard resistors used by the NIST-4 Watt Balance involves multiple resistance standards and bridges to