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Search Publications by: Steven J Choquette (Fed)

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Displaying 1 - 25 of 36

The Digital NIST: Challenges And Opportunities in the Digital Transformation of NIST's Reference Materials

March 30, 2023
Author(s)
William Dinis Camara, Steven J. Choquette, Katya Delak, Robert Hanisch, Benjamin Long, Melissa M. Phillips, Jared Ragland, Kate Rimmer
Early in 2022 NIST embarked on a pilot project to produce digital calibration reports and digital certificates of analysis for reference materials. The goal of the project is to produce a few examples of digital reports and certificates for the purpose of

The Digital NIST: Challenges And Opportunities in the Digital Transformation of NIST's Reference Materials

September 21, 2022
Author(s)
William Dinis Camara, Steven J. Choquette, Katya Delak, Robert Hanisch, Benjamin Long, Melissa M. Phillips, Jared Ragland, Kate Rimmer
Early in 2022 NIST embarked on a pilot project to produce digital calibration reports and digital certificates of analysis for reference materials. The goal of the project is to produce a few examples of digital reports and certificates for the purpose of

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

September 16, 2021
Author(s)
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael Epstein, Margaret Kline, Katrice Lippa, Enrico Lucon, John L. Molloy, Michael Nelson, Karen W. Phinney, Maria Polakoski, Antonio Possolo, Lane C. Sander, John E. Schiel, Katherine E. Sharpless, Michael R. Winchester, Donald Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged with establishing a measurement foundation to facilitate U.S. and international commerce. NIST

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

July 15, 2020
Author(s)
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael Epstein, Margaret C. Kline, Katrice Lippa, Enrico Lucon, Karen W. Phinney, Maria Polakoski, Antonio Possolo, Katherine E. Sharpless, John R. Sieber, Blaza Toman, Michael R. Winchester, Donald Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged with establishing a measurement foundation to facilitate U.S. and international commerce. NIST

NIST Reference Materials: Their Purpose and Their Future

March 15, 2020
Author(s)
Steven J. Choquette, David L. Duewer, Katherine E. Sharpless
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged with establishing a measurement foundation to facilitate U.S. and international commerce. This

Co-Operation in Publicly Funded Reference Material Production Meeting Report

October 12, 2018
Author(s)
Steven J. Choquette, Hakan Emteborg, Doris florian, Stephen Ellison, Lindsay Mackay, Pearse McCarron
The meeting was organized by the European Commission's Joint Research Centre, and held at the JRC-Geel site on 22-23 February, 2018. It was a follow-up of a similar meeting held in 2009. The objective of the meeting was to exchange information about

NIST Spectroscopic Measurement Standards

May 1, 2018
Author(s)
Paul C. DeRose, Kenneth D. Cole, Aaron Urbas, Steven J. Choquette, Evelyn Solis, Erica V. Stein, John E. Schiel, Brian Lang, Hua-Jun He
Ultraviolet (UV) absorbance measurements provide a rapid and reliable method to determine protein concentrations. The National Institute of Standards and Technology (NIST) has developed Standard Reference Material (SRM) 2082as a pathlength standard for UV

Development of NIST Standard Reference Material 2082, a Pathlength Standard for Measurements in the Ultraviolet Spectrum

July 10, 2017
Author(s)
Brian Lang, Aaron A. Urbas, Paul C. DeRose, Hung-Kung Liu, John C. Travis, Steven J. Choquette, Kenneth D. Cole
New spectrophotometers and cuvettes have been designed to allow the measurement of absorbance values from samples using microliter volume sizes. These measurements are done using short pathlengths to decrease the sample volumes required. The major

Certified DNA Reference Materials to Compare HER2 Gene Amplification Measurements Using Next- Generation Sequencing Methods

September 1, 2016
Author(s)
Chih-Jian Lih, Robin D. Harrington, Kneshay Harper, David J. Sims, Paul McGregor, Corinne Camalier, Han Si, Biswajit Das, P. M. Williams, Hua-Jun He, Jamie L. Almeida, Steven Lund, Steven J. Choquette, Kenneth D. Cole
The National Institute of Standards and Technology (NIST) Standard Reference Materials 2373 is a set of genomic DNA samples prepared from five breast cancer cell lines with certified values for the ratio of the HER2 gene copy number to the copy numbers of

Performance Benchmarking and Intensity Calibration of a Widefield Fluorescence Microscope Using Fluorescent Glass

August 11, 2014
Author(s)
Michael W. Halter, Elianna Bier, Paul C. DeRose, Gregory A. Cooksey, Steven J. Choquette, Anne L. Plant, John T. Elliott
Widefield fluorescence microscopy is a highly used tool for visually assessing biological samples and for quantifying cell responses. Despite its widespread use in high content analysis and other screening applications, few published methods exist for

Measurement of Scattering and Absorption Cross Sections of Dyed Microspheres

January 14, 2013
Author(s)
Adolfas Gaigalas, Steven J. Choquette
Measurements of absorbance and fluorescence emission were carried out on aqueous suspensions of polystyrene (PS) microspheres with a diameter of 2.5 µm. Microspheres with and without green BODIPY@ dye were measured. Placing the suspension inside an

Automated Spectral Smoothing with Spatially Adaptive Penalized Least-Squares

June 1, 2011
Author(s)
Aaron A. Urbas, Steven J. Choquette
A variety of data smoothing techniques exist to address the issue of noise in spectroscopic data. The vast majority, however, require parameter specification by a knowledgeable user, which is typically accomplished by trial and error. In most situations