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NIST Authors in Bold

Displaying 1 - 25 of 2403

AbsorbanceQ: An App for Generating Absorbance Images from Brightfield Images

January 4, 2022
Author(s)
Stephen Zimmerman, Carl Simon Jr., Greta Babakhanova
The AbsorbanceQ app converts brightfield microscope images into absorbance images that can be analyzed and compared across different operators, microscopes and time. Absorbance-based measurements are comparable, which is useful when the aim is to

Mixture model analysis of Transition Edge Sensor pulse height spectra

December 9, 2021
Author(s)
Kevin J. Coakley, Jolene Splett, Thomas Gerrits
To calibrate an optical transition edge sensor, for each pulse of the light source (e.g., pulsed laser), one must determine the ratio of the expected number of photons that deposit energy and the expected number of photons created by the laser. Based on

HDX-MS and MD simulations provide evidence for stabilization of the IgG1- FcgRIa (CD64a) immune complex through intermolecular glycoprotein bonds

December 8, 2021
Author(s)
Kyle Anderson, Kerry Scott, Christina Bergonzo, Ioannis Karageorgos, Elyssia Gallagher, Venkata Tayi, Michael Butler, Jeffrey W. Hudgens
Previous reports present different models for the stabilization of the Fc—FcγRI immune complex. Although accord exists on the importance of L235 in IgG1 and some hydrophobic contacts for complex stabilization, discord exists regarding the existence of

MICROMETROLOGY IN PURSUIT OF QUANTUM RADIATION STANDARDS

November 9, 2021
Author(s)
Ryan P. Fitzgerald, Zeeshan Ahmed, Denis E. Bergeron, Nikolai Klimov, Dan Schmidt, Ronald Tosh
With the recent redefinition of the SI base units in terms of constants of nature, the race is on to maximize achievable precision by developing primary standards based on quantum metrology, thereby to realize the Quantum SI. For the becquerel (Bq) and

A Resilient Architecture for the Realization and Distribution of Coordinated Universal Time to Critical Infrastructure Systems in the United States: Methodologies and Recommendations from the National Institute of Standards and Technology (NIST)

November 3, 2021
Author(s)
Jeffrey Sherman, Ladan Arissian, Roger Brown, Matthew J. Deutch, Elizabeth Donley, Vladislav Gerginov, Judah Levine, Glenn Nelson, Andrew Novick, Bijunath Patla, Tom Parker, Benjamin Stuhl, Jian Yao, William Yates, Michael A. Lombardi, Victor Zhang, Douglas Sutton
The Time and Frequency Division of the National Institute of Standards and Technology (NIST), an agency of the United States Department of Commerce (DOC), was tasked with fulfilling Section 4, Part (i) of the Position, Navigation and Timing (PNT) Executive

Electro-optically derived millimeter-wave sources with phase and amplitude control

October 12, 2021
Author(s)
Bryan Bosworth, Nick Jungwirth, Kassi Smith, Jerome Cheron, Franklyn Quinlan, Ari Feldman, Dylan Williams, Nate Orloff, Chris Long
Integrated circuits are building blocks in millimeter-wave handsets and base stations, requiring nonlinear characterization to optimize performance and energy efficiency. Today's sources use digital-to-analog converters to synthesize arbitrary electrical

X-ray Computed Tomography Instrument Performance Evaluation, Part III: Sensitivity to Detector Geometry and Rotation Stage Errors at Different Magnifications

September 29, 2021
Author(s)
Prashanth Jaganmohan, Bala Muralikrishnan, Meghan Shilling, Ed Morse
With steadily increasing use in dimensional metrology applications, especially for delicate parts and those with complex internal features, X-ray computed tomography (XCT) has transitioned from a medical imaging tool to an inspection tool in industrial

Quantum-Based Photonic Sensors for Pressure, Vacuum, and Temperature Measurements: A Vison of the Future with NIST on a Chip

September 17, 2021
Author(s)
Jay H. Hendricks, Zeeshan Ahmed, Daniel Barker, Kevin O. Douglass, Stephen Eckel, James A. Fedchak, Nikolai Klimov, Jacob Edmond Ricker, Julia Scherschligt
The NIST on a Chip (NOAC) program's central idea is the idea that measurement technology can be developed to enable metrology to be performed "outside the National Metrology Institute" by the crea-tion of deployed and often miniaturized standards. These

Metrological Tools for the Reference Materials and Reference Instruments of the NIST Material Measurement Laboratory

September 16, 2021
Author(s)
Carlos R. Beauchamp, Johanna Camara, Jennifer Carney, Steven J. Choquette, Kenneth D. Cole, Paul C. DeRose, David L. Duewer, Michael Epstein, Margaret Kline, Katrice Lippa, Enrico Lucon, John L. Molloy, Michael Nelson, Karen W. Phinney, Maria Polakoski, Antonio Possolo, Lane C. Sander, John E. Schiel, Katherine E. Sharpless, Michael R. Winchester, Donald Windover
The National Institute of Standards and Technology (NIST), formerly the National Bureau of Standards, was established by the U.S. Congress in 1901 and charged with establishing a measurement foundation to facilitate U.S. and international commerce. NIST
Displaying 1 - 25 of 2403