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Displaying 1 - 25 of 1525

Quasi-Deterministic Channel Propagation Model for an Urban Environment at 28 GHz

April 16, 2021
Neeraj Varshney, Jian Wang, Chiehping Lai, Camillo Gentile
We reduced parameters of the Quasi-Deterministic channel propagation model, recently adopted by the IEEE 802.11ay task group for next-generation Wi-Fi at millimeter-wave, from measurements collected in an urban environment with our 28 GHz directional

Josephson Microwave Sources Applied to Quantum Information Systems

December 18, 2020
Adam J. Sirois, Manuel C. Castellanos Beltran, Anna E. Fox, Samuel P. Benz, Peter F. Hopkins
Quantum computers with thousands or millions of qubits will require a scalable solution for qubit control and readout electronics. Colocating these electronics at millikelvin temperatures has been proposed and demonstrated, but there exist significant

Noise Influence on Scattering-Parameter Measurements

November 4, 2020
Dazhen Gu, Jeffrey A. Jargon, Matthew J. Ryan, Anouk Hubrechsen
We present a general model of noise-influenced scattering (S) parameter measurements performed by a vector network analyzer (VNA). The residual error of the S-parameter due to the noise appears like a complex Gaussian quotient. The statistical analysis of

Note: A Radio Frequency Voltage-Controlled Current Source for Quantum Spin Manipulation

October 19, 2020
Daniel S. Barker, Alessandro Restelli, James A. Fedchak, Julia K. Scherschligt, Stephen P. Eckel
We present a design for a wide-bandwidth, voltage-controlled current source that is easily integrated with radiofrequency magnetic field coils. Our design uses current feedback to compensate for the frequency-dependent impedance of a radiofrequency antenna

Blind Calibration of Phase Drift in Millimeter-Wave Channel Sounders

June 11, 2020
Jack Chuang, Jelena Senic, Chunmei Liu, Camillo Gentile, Sung Yun Jun, Derek Caudill
Millimeter-wave channel sounders are much more sensitive to phase drift than their microwave counterparts by virtue of shorter wavelength. This matters when coherently phasing (electronic or mechanical) antenna scans collected over seconds, minutes, or

Blind Measurement of Receiver System Noise

June 5, 2020
Daniel G. Kuester, Adam J. Wunderlich, Duncan A. McGillivray, Dazhen Gu, Audrey Puls
Tightly packaged receive systems pose a challenge for noise measurements. The only available receiver outputs are often user data: link benchmark or diagnostic information that can be scavenged with software. These could include data rate benchmark, self

A Multi-Band Rydberg-Atom Based Receiver/Antenna: AM/FM Stereo Reception

April 2, 2020
Christopher L. Holloway, Matthew T. Simons, Joshua A. Gordon
With the re-definition of the International System of Units (SI) that occurred in October of 2018, there has recently been a great deal of attention in the development atom-base sensors for metrology applications. In particular great progress had been made

Field-Only Surface Integral Equations: Scattering from a Perfect Electric Conductor

February 1, 2020
Qiang Sun, Evert Klaseboer, Alex Yuffa, Derek Y. Chan
A field-only boundary integral formulation of electromagnetics is derived without the use of surface currents that appear in the Stratton--Chu formulation. For scattering by a perfect electrical conductor (PEC), the components of the electric field are

Synaptic weighting in single flux quantum neuromorphic computing

January 22, 2020
Michael L. Schneider, Christine A. Donnelly, Ian W. Haygood, Alex Wynn, Stephen E. Russek, Manuel C. Castellanos Beltran, Paul D. Dresselhaus, Peter F. Hopkins, Matthew R. Pufall, William H. Rippard
Josephson junctions act as a natural spiking neuron-like device for neuromorphic computing. By leveraging the advances recently demonstrated in digital single flux quantum (SFQ) circuits and using recently demonstrated magnetic Josephson junction (MJJ)

Field Compressed Sensing

January 17, 2020
Anthony B. Kos, Fabio C. Da Silva, Jason B. Coder, Craig W. Nelson, Grace E. Antonucci, Archita Hati
Imaging solutions based on wave scattering seek real-time performance, high dynamic range, and spatial accuracy at scales spanning from nanometers to thousands of kilometers. Compressed sensing algorithms use sparsity to reduce sample size during image

Optimal Series Resistors for On-Wafer Calibrations

November 8, 2019
Jasper A. Drisko, Richard A. Chamberlin, James C. Booth, Nathan D. Orloff, Christian J. Long
The series resistor is a common on-wafer device typically used in the series-resistor calibration and for estimating the capacitance per unit length of coplanar waveguide transmission lines. While much work has been done using series resistors, this paper

Embedding a Rydberg Atom-Based Sensor into an Antenna for Phase and Amplitude Detection of Radio Frequency Fields and Modulated Signals

October 22, 2019
Christopher L. Holloway, Matthew T. Simons, Abdulaziz H. Haddab, Joshua A. Gordon, David R. Novotny
We demonstrate a Rydberg atom-based sensor embedded in a parallel-plate waveguide (PPWG) for amplitude and phase detection of a radio-frequency (RF) electric field. This embedded atomic sensor is also capable of receiving modulated communications signals

Nanobolometer with ultralow noise equivalent power

October 11, 2019
Roope J. Kokkoniemi, Joonas Govenius, Visa Vesterinen, Russell Lake, A M. Gunyho, K-Y Tan, S Simbierowicz, Leif Gronberg, J Lehtinen, M Prunnila, Juha Hassel, Antti Lamminen, O P. Saira, Mikko Mottonen
Since the introduction of bolometers more than a century ago, they have been used in various applications ranging from chemical sensors, consumer electronics, and security to particle physics and astronomy. However, faster bolometers with lower noise are

Design of an intelligent PYTHON code to run coupled and license-free finite-element and statistical analysis software for calibration of near-field scanning microwave microscopes

October 2, 2019
Jeffrey T. Fong, Nathanael A. Heckert, James J. Filliben, Pedro V. Marcal, Samuel Berweger, Thomas M. Wallis, Pavel Kabos
To calibrate near-field scanning microwave microscopes (NSMM) for defect detection and characterization in semiconductors, it is common to develop a parametric finite element analysis (FEA) code to guide the microscope user on how to optimize the settings
Displaying 1 - 25 of 1525