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Publications

NIST Authors in Bold

Displaying 1 - 25 of 1519

Josephson Microwave Sources Applied to Quantum Information Systems

Author(s)
Adam J. Sirois, Manuel C. Castellanos Beltran, Anna E. Fox, Samuel P. Benz, Peter F. Hopkins
Quantum computers with thousands or millions of qubits will require a scalable solution for qubit control and readout electronics. Colocating these electronics

Noise Influence on Scattering-Parameter Measurements

Author(s)
Dazhen Gu, Jeffrey A. Jargon, Matthew J. Ryan, Anouk Hubrechsen
We present a general model of noise-influenced scattering (S) parameter measurements performed by a vector network analyzer (VNA). The residual error of the S

Blind Measurement of Receiver System Noise

Author(s)
Daniel G. Kuester, Adam J. Wunderlich, Duncan A. McGillivray, Dazhen Gu, Audrey Puls
Tightly packaged receive systems pose a challenge for noise measurements. The only available receiver outputs are often user data: link benchmark or diagnostic

Synaptic weighting in single flux quantum neuromorphic computing

Author(s)
Michael L. Schneider, Christine A. Donnelly, Ian W. Haygood, Alex Wynn, Stephen E. Russek, Manuel C. Castellanos Beltran, Paul D. Dresselhaus, Peter F. Hopkins, Matthew R. Pufall, William H. Rippard
Josephson junctions act as a natural spiking neuron-like device for neuromorphic computing. By leveraging the advances recently demonstrated in digital single

Field Compressed Sensing

Author(s)
Anthony B. Kos, Fabio C. Da Silva, Jason B. Coder, Craig W. Nelson, Grace E. Antonucci, Archita Hati
Imaging solutions based on wave scattering seek real-time performance, high dynamic range, and spatial accuracy at scales spanning from nanometers to thousands

Optimal Series Resistors for On-Wafer Calibrations

Author(s)
Jasper A. Drisko, Richard A. Chamberlin, James C. Booth, Nathan D. Orloff, Christian J. Long
The series resistor is a common on-wafer device typically used in the series-resistor calibration and for estimating the capacitance per unit length of coplanar

Nanobolometer with ultralow noise equivalent power

Author(s)
Roope J. Kokkoniemi, Joonas Govenius, Visa Vesterinen, Russell Lake, A M. Gunyho, K-Y Tan, S Simbierowicz, Leif Gronberg, J Lehtinen, M Prunnila, Juha Hassel, Antti Lamminen, O P. Saira, Mikko Mottonen
Since the introduction of bolometers more than a century ago, they have been used in various applications ranging from chemical sensors, consumer electronics

Machine Learning in a Quality Managed RF Measurement Workflow

Author(s)
Aric W. Sanders, John Bass, Arpita Bhutani, Mary A. Ho, James C. Booth
Advances in artificial intelligence, or more specifically machine learning, have made it possible for computers to recognize patterns as well or better than
Displaying 1 - 25 of 1519