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PUBLICATIONS

A Measurement-Referenced Error Vector Magnitude for Counterfeit Cellular Device Detection

Published

Author(s)

Ameya Ramadurgakar, Kate Remley, Dylan Williams, Jake Rezac, MELINDA PIKET-MAY, Rob Horansky

Abstract

Standard formulations of error vector magnitude compare a wireless device's symbol constellation to an ideal reference constellation. In this work, we utilize the residual error vector magnitude, which uses measurements of a wireless device to define a reference constellation. We apply this formulation to the problem of identifying a device's manufacturer from over-the-air measurements of the wireless device and show that the residual error vector magnitude outperforms standard error vector magnitude formulation in this task.
Proceedings Title
2023 101st ARFTG Microwave Measurement Conference (ARFTG)
Conference Dates
June 11-16, 2023
Conference Location
San Diego, CA, US
Pub Type
Conferences

Download Paper

https://doi.org/10.1109/ARFTG57476.2023.10279175
Local Download

Keywords

Error Vector Magnitude(EVM), residual EVM, user equipment(UE), over-the-Air (OTA), wireless system, vector signal analyzer(VSA), long term evolution(LTE)
Electromagnetics

Citation

Ramadurgakar, A. , Remley, K. , Williams, D. , Rezac, J. , Piket-May, M. and Horansky, R. (2023), A Measurement-Referenced Error Vector Magnitude for Counterfeit Cellular Device Detection, 2023 101st ARFTG Microwave Measurement Conference (ARFTG), San Diego, CA, US, [online], https://doi.org/10.1109/ARFTG57476.2023.10279175, https://tsapps.nist.gov/publication/get_pdf.cfm?pub_id=935930 (Accessed April 27, 2024)

Created October 17, 2023, Updated December 22, 2023