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NIST Authors in Bold

Displaying 24701 - 24725 of 73697

Modelling Dynamic Aerosol Processes for Indoor Ultrafine Particles

June 5, 2011
Author(s)
Dong H. Rim, Lance L. Wallace, Andrew K. Persily, Jung I. Choi
This study has investigated aerosol transformation processes for four common sources of indoor ultrafine particles (UFP): gas stove, electric stove, candle, and hair dryer. For each of the four UFP sources, the temporal change in particle size distribution

Ultrafine Particles: 3 Years of Measurements in the NIST Test House

June 5, 2011
Author(s)
Lance L. Wallace, Andrew K. Persily, Steven J. Emmerich, Dong H. Rim, Chi P. Hoang, Cynthia H. Reed, Wang Fang, M E. Greene, Jung I. Choi
NIST has supported research characterizing ultrafine particle sources and dynamics for more than a decade. Over 90 % of ultrafine particles (UFP) produced by stovetop cooking on both gas and electric stoves were 10 nm. Using the NIST test house

Volatile Organic Compound Concentrations and Estimation of Optimal Source Strengths to Achieve a High Level of Acceptance Indoors using Multi- Zone Simulation

June 5, 2011
Author(s)
Helena Jarnstrom, William Stuart Dols, Cynthia H. Reed, Andrew K. Persily
This study investigated the possibility of identifying chemical pollutant profiles and concentration levels that result in a high level of acceptance indoors. In addition, a multi-zone simulation tool, CONTAM, developed by the National Institute of

Deembedding parasitic elements of GaN nanowire MESFETs by use of microwave measurements

June 3, 2011
Author(s)
Dazhen Gu, Thomas M. Wallis, Paul T. Blanchard, SangHyun S. Lim, Atif A. Imtiaz, Kristine A. Bertness, Norman A. Sanford, Pavel Kabos
We present a deembedding roadmap for extracting parasitic elements of a nanowire (NW) MESFET device from full two-port scattering-parameter measurements in the frequency range from 0.1 GHz to 25 GHz. The NW MESFET is integrated in a microwave coplanar

Interlaboratory Reproducibility of Size and Surface Charge Measurements on Nanoparticles prior to Biological Impact Assessment

June 3, 2011
Author(s)
Gert Roebben, Sonia Ramirez-Garcia, Vincent A. Hackley, Matthias Roesslein, Fred Klaessig, Vikram Kestens, Iseult Lynch, C. M. Garner, Alan Rawle, Allison Elder, Vicky Colvin, Wolfgang Kreyling, Harald Krug, Zuzanna Lewicka, Scott McNeil, Andre Nel, Anil K. Patri, Peter Wick, Tian Xia, Guenther Oberdoerster, Kenneth Dawson
The International Alliance for NanoEHS Harmonization (IANH) organises interlaboratory comparisons of methods relevant for a better understanding of the biological impacts of nano-objects, to highlight and remove sources of irreproducibility in existing

Numerical test of few-qubit clock protocols

June 3, 2011
Author(s)
Till P. Rosenband
The stability of several clock protocols based on 2 to 20 entangled atoms is evaluated numerically, by a simulation that includes the effect of decoherence due to classical oscillator noise. In this context the squeezed states proposed by Andre, Sorensen

Observing the average trajectories of single photons in a two-slit interferometer

June 3, 2011
Author(s)
Sacha Kocsis, Boris Braverman, Sylvain Ravets, Martin Stevens, Richard Mirin, L. Krister Shalm, Aephraim M. Steinberg
A consequence of the quantum mechanical uncertainty principle is that one may not discuss the path or "trajectory" that a quantum particle takes, because any measurement of position irrevocably disturbs the momentum, and vice versa. Using weak measurements

Three-dimensional imaging of liquid crystal structures and defects by means of holographic manipulation of colloidal nanowires with faceted sidewalls

June 3, 2011
Author(s)
David Engstrom, Martin Persson, Rahul P. Trivedi, Kristine A. Bertness, Mattias Goksor, Ivan I. Smalyukh
We use nanowires with faceted sidewalls for mapping of the patterns of three-dimensional orientational order and defect structures. In chiral nematics, the nanowires follow the local average orientation of rod-shaped molecules. When spatially translated by

Statistical Methods for Analyzing Color Differences

June 2, 2011
Author(s)
Maria E. Nadal, Carl C. Miller, Hugh Fairman
Multi-valued measurands, such as spectral reflectance or transmission, tristimulus values, are usually analyzed by reducing the data to a single-valued parameter, such as color difference. The variations of sets of color differences are non-normal

A Physics-Based Simple Series Resistance Extraction Methodology

June 1, 2011
Author(s)
Kin P. Cheung, Jason P. Campbell
Series resistance has become a serious obstacle encountered in the development of advanced CMOS devices. At the same time, series resistance quantification in these same advanced CMOS devices is a difficult challenge. In this study, we demonstrate a very

Automated Spectral Smoothing with Spatially Adaptive Penalized Least-Squares

June 1, 2011
Author(s)
Aaron A. Urbas, Steven J. Choquette
A variety of data smoothing techniques exist to address the issue of noise in spectroscopic data. The vast majority, however, require parameter specification by a knowledgeable user, which is typically accomplished by trial and error. In most situations

Boundary Effects on the Determination of the Effective Parameters of a Metamaterial from Normal Incidence Reflection and Transmission

June 1, 2011
Author(s)
Sung Kim, Edward E. Kuester, Christopher L. Holloway, James R. Baker-Jarvis, Aaron D. Scher
This paper presents a method for the determination of the effective electromagnetic parameters of a metamaterial, taking boundary effects at the interfaces between a conventional material and metamaterial into account. In the technique presented here

Bridging the Micro to Macro Gap: A New Application for Milli-probe X-ray Fluorescence

June 1, 2011
Author(s)
Jeffrey M. Davis, Dale E. Newbury, Nicholas W. Ritchie, Edward P. Vicenzi, Dale P. Bentz, Albert J. Fahey
X-ray elemental mapping and x-ray spectrum imaging are powerful microanalytical tools. However, their scope is limited spatially by the raster area of a scanning electron microscope or microprobe. Limited sampling size becomes a significant issue when

Certification of Standard Reference Material 660b

June 1, 2011
Author(s)
David R. Black, Donald A. Windover, Albert Henins, James J. Filliben, James P. Cline
The National Institute of Standards and Technology (NIST) certifies a suite of Standard Reference Materials (SRMs) to address specific aspects of instrument performance of powder diffractometers. This report describes SRM 660b, the third generation of this

Challenges and Opportunities in Smart Grid: A Position Article

June 1, 2011
Author(s)
George W. Arnold
This introductory article overviews the concepts and purpose of the Smart Grid and the important role of communications technology in its development. It identifies some of the challenges and opportunities that are explored in more detail in the articles
Displaying 24701 - 24725 of 73697
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