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Displaying 2376 - 2400 of 2581

Interlaboratory comparison of InGaAsP EX-SITU characterization

January 1, 2003
Author(s)
Alexana Roshko, Kristine A. Bertness
A study to improve the accuracy of ex-situ characterization of InGaAsP materials for optoelectronics is underway. Six InGaAsP thin film specimens, with nominal photoluminescence wavelengths of 1.1, 1.3 and 1.5 mm, have been measured, with X-ray diffraction

X-ray diffraction, photoluminescence and composition standards of compound semiconductors

January 1, 2003
Author(s)
Alexana Roshko, Kristine A. Bertness, J T. Armstrong, Ryna B. Marinenko, Marc L. Salit, Lawrence H. Robins, Albert J. Paul, R J. Matyi
Work is underway to develop composition standards and standardized assessment procedures for compound semiconductors. An AlGaAs composition standard with less than 2% uncertainty is being developed. The improved accuracy of this standard is being achieved

Composition standards for III-V semiconductor epitaxial films

November 11, 2002
Author(s)
Kristine A. Bertness, Lawrence H. Robins, J T. Armstrong, Ryna B. Marinenko, Albert J. Paul, Marc L. Salit
A program is underway at NIST to establish standard reference materials (SRMs) for the calibration of instruments used to measure the chemical composition of epitaxially grown III-V semiconductor thin films. These SRMs are designed for the calibration of

Trace water detection in semiconductor-grade phosphine gas

November 11, 2002
Author(s)
Kristine A. Bertness, Susan Y. Lehman, Joseph T. Hodges, H. H. Funke, Mark W. Raynor
We are applying cavity ring-down spectroscopy (CRDS) to measure water concentrations in nitrogen and, for the first time to our knowledge, in phosphine. Semiconductor-grade phosphine cylinders from different suppliers contained water in the several ppm

Four-state measurement method for polarization dependent wavelength shift

September 1, 2002
Author(s)
William C. Swann, Shellee D. Dyer, Rex M. Craig
We present a novel four-state method for measuring the polarization dependent wavelength shift (PDW) of a fiber Bragg grating. We show that measurement of the grating's wavelength for only four different polarization states is sufficient to completely

Threshold Resonance Spectroscopy: A Key to Cold Collision Physics

September 1, 2002
Author(s)
Paul S. Julienne
Threshold scattering resonances play a crucial role in cold collision physics and cold molecule formation from cold atoms. We describe several examples involving magnetic Feshbach spectroscopy of Cs atoms, photoassociation of Na atoms in a Bose-Einstein

Formation of InAs/GaAs quantum dots by dewetting during cooling

July 1, 2002
Author(s)
Richard P. Mirin, Alexana Roshko, M. van der Puijl, Andrew G. Norman
We describe a method to form InAs quantum dots on GaAs by cooling an InAs film that is deposited at high substrate temperatures. The reflection high-energy electron diffraction pattern taken after deposition of 1.9 monolayers of InAs on (100) GaAs at 540

Wavelength references for 1300-nm wavelength division multiplexing

May 1, 2002
Author(s)
Tasshi Dennis, E. A. Curtis, C. W. Oates, Leo W. Hollberg, Sarah L. Gilbert
We have conducted a study of potential wavelength calibration references for use as both moderate-accuracy transfer standards and high-accuracy National Institute of Standards and Technology (NIST) internal references in the 1280-1320 nm wavelength
Displaying 2376 - 2400 of 2581
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