Craig, R.
(2003),
Measurement assurance program for wavelength dependence of polarization dependent loss in fiber optic devices over the wavelength range from 1535 nm to 1560 nm, Special Publication (NIST SP), National Institute of Standards and Technology, Gaithersburg, MD, [online], https://doi.org/10.6028/NIST.SP.250-60
(Accessed September 18, 2024)
Official websites use .gov
A .gov website belongs to an official government organization in the United States.
Secure .gov websites use HTTPS
A lock (
) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.
Measurement assurance program for wavelength dependence of polarization dependent loss in fiber optic devices over the wavelength range from 1535 nm to 1560 nm
Published
Author(s)
Abstract
This paper provides the documentation to establish a measurement assurance program (MAP) using an optical fiber diattenuator for the calibration of polarization-dependent loss (PDL) across the 1535 to 1560 nm range of telecommunication wavelengths. This MAP transfer standard (or artifact) is based on an all fiber design with well-characterized PDL as a function of wavelength and temperature. This MAP is intended for the calibration of PDL measurement equipment, and is not intended for the simulation of PDL in actual systems. This document details the uncertainty analysis, certification procedure and suggested use for the MAP.Citation
Special Publication (NIST SP) - 250-60
Report Number
250-60
NIST Pub Series
Pub Type
NIST Pubs
Download Paper
Keywords
diattenuator, fiber optic, measurement assurance program, Mueller matrix, PDL, polarization dependent loss, spectral dependence, wavelength-dependence, WDM
Citation
Issues
If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.
Created February 1, 2003, Updated November 10, 2018