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Displaying 2226 - 2250 of 4226

Ontology Formalisms: What is Appropriate for Different Applications?

October 6, 2009
Author(s)
Craig I. Schlenoff
Ontologies can take many forms. There are ontologies that are extremely formal (e.g., using first order logic), and there are ontologies that are much less formally defined (e.g., ontologies in the relational databases or dictionaries). Nonetheless, all of

A Service Oriented Framework for Construction Supply Chain Integration

October 1, 2009
Author(s)
Jack Cheng, Kincho H. Law, Albert T. Jones, Ram D. Sriram
Supply chain management integrates key business processes and facilities, involving end users and suppliers that provide products, services and information. Supply chain integration can potentially add value to the stakeholders along product development

Influence of room temperature control system on AFM imaging

October 1, 2009
Author(s)
Joseph Fu, Wei Chu, Theodore V. Vorburger
As technology progresses, the control of environment for experiments is also getting more sophisticated; such as the control of lab temperature and vibration. Temperature controlled within ± 0.25° C for a general purpose lab is common place. We illustrate

The Dimensional Markup Language Specification for Inspection Results Data

October 1, 2009
Author(s)
William G. Rippey
The Dimensional Markup Language (DML) specification defines a data model and Extensible Model Language (XML) encoding rules for dimensional inspection results for discrete parts. To support manufacturing quality assurance processes, DML results files are

Update on DMIS Certification

October 1, 2009
Author(s)
William G. Rippey
The Dimensional Standards Consortium (DMSC) and the National Institute of Standards and Technology (NIST) announced the rollout of the DMSC's DMIS Certification Program at the International Manufacturing Technology Show (IMTS), September 2008. The

Measurement Traceability and Quality Assurance in a Nanomanufacturing Environment

September 25, 2009
Author(s)
Ndubuisi G. Orji, Ronald G. Dixson, Aaron Cordes, Benjamin Bunday, John Allgair
A key requirement for nano-manufacturing is maintaining acceptable traceability of measurements performed to determine size. Given that properties and functionality at the nanoscale are governed by absolute size, maintaining the traceability of dimensional

Electrochemical Micromachining of Hastelloy B-2 with Ultrashort Voltage Pulses

September 8, 2009
Author(s)
Gordon A. Shaw, Joseph J. Maurer, Steven E. Fick, Thomas P. Moffat, J. J. Mallett, John L. Hudson
Electrochemical micromachining (ECMM) with ultrashort voltage pulses, a maskless all-electrochemical micro and nanofabrication technique, has been used to fabricate microstructures on a corrosion resistant nickel-based superalloy, Hastelloy B-2. Because of

Nanometrology Solutions Using an Ultra-High Resolution In-lens SEM

September 1, 2009
Author(s)
Michael T. Postek, Andras Vladar, John S. Villarrubia
The imaging and measurement of nanostructures such as particles, carbon nanotubes, and quantum dots have placed new demands on the high resolution imaging capabilities of scanning electron microscopes. A barrier to accurate dimensional metrology is the

Formal Representation of Product Design Specifications for Validating Product Designs

August 27, 2009
Author(s)
Alex Weissman, Satyandra K. Gupta, Xenia Fiorentini, Sudarsan Rachuri, Ram D. Sriram
Large scale distributed design projects increasingly result in designs that do not fully conform to the stated design goals or specifications. Hence, there is a need to validate these designs against various requirements. For projects with a large set of
Displaying 2226 - 2250 of 4226
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