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Search Publications

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Displaying 21926 - 21950 of 74229

Towards Demand Response Measurement and Verification Standards

May 1, 2013
Author(s)
David G. Holmberg, David Hardin, Ed Koch
The value and impact of demand response (DR) at grid-scale depends upon the widespread and active participation of a diverse customer base. The level of participation by customers is impacted by financial compensation and return-on-investment. The role of

Transmission EBSD in the Scanning Electron Microscope

May 1, 2013
Author(s)
Roy H. Geiss, Katherine P. Rice, Robert R. Keller
A new method for obtaining Kikuchi diffraction patterns from thin specimens in transmission has been developed for use in the SEM, scanning electron microscope, using a conventional electron backscatter diffraction (EBSD) detector and with a slight

Interfacial Coupling in Multiferroic/Ferromagnet Heterostructures

April 30, 2013
Author(s)
M. Trassin, J. D. Clarkson, Samuel R. Bowden, j. Liu, J. T. Heron, R. J. Paull, Elke Arenholz, Daniel T. Pierce, John Unguris
We report local probe investigations of the magnetic interaction between BiFeO3 films and a ferromagnetic Co0.9Fe0.1 layer. Within the constraints of intralayer exchange coupling in the Co0.9Fe0.1, the multiferroic imprint in the ferromagnet results in a

Large Stroke Electrostatic Comb Drive Actuators Enabled by a Novel Flexure Mechanism

April 30, 2013
Author(s)
Mohammad Olfatnia, Siddharth Sood, Jason J. Gorman, Shorya Awtar
This paper reports in-plane electrostatic combdrive actuators with stroke as large as 245 μm that is achieved by employing a novel Clamped Paired Double Parallelogram (C-DPDP) flexure mechanism. The C-DP-DP flexure mechanism design offers high bearing

Topological Insulator Bi2Se3 Nanowire High Performance Field-Effect Transistors

April 30, 2013
Author(s)
Hao Zhu, Curt A. Richter, Erhai Zhao, John E. Bonevich, William A. Kimes, Hyuk-Jae Jang, Hui Yuan, Abbas Arab, Oleg A. Kirillov, James E. Maslar, D. E. Ioannou, Qiliang Li
Topological insulators are unique electronic materials with insulating interiors but robust metallic surfaces. Device applications exploiting their remarkable properties, such as surface conduction of helical Dirac electrons, have so far been hampered by

TSV Reveal height and bump dimension metrology by the TSOM method

April 30, 2013
Author(s)
Ravikiran Attota, Haesung Park, Victor H. Vartanian, Ndubuisi G. Orji, Richard A. Allen
Through-focus scanning optical microscopy (TSOM) transforms conventional optical microscopes into truly 3D metrology tools for nanoscale- to- microscale dimensional analysis with nanometer-scale sensitivity. Although not a resolution enhancement method

Use of TSOM for sub-11 nm node pattern defect detection and HAR features

April 30, 2013
Author(s)
Ravikiran Attota, Abraham Arceo, Bunday Benjamin
In-line metrologies currently used in the semiconductor industry are being challenged by the aggressive pace of device scaling and the adoption of novel device architectures. In defect inspection, conventional bright field techniques will not likely be

Limits in Modeling Power Grid Topology

April 29, 2013
Author(s)
Brian D. Cloteaux
Because of their importance to infrastructure, a number of studies have examined the structural properties of power grids and have proposed random topological models of them. We examine the ability to create generalized models of power grid structure by

Wide Angle Polarization Analysis with Neutron Spin Filters

April 29, 2013
Author(s)
Qiang NMN Ye, Thomas R. Gentile, Jeffrey R. Anderson, Collin L. Broholm, WangChun Chen, Z DeLand, Ross W. Erwin, C. B. Fu, John E. Fuller III, Aaron V. Kirchhoff, J. A. Rodriguez-Rivera, V. Thampy, T G. Walker, Shannon Watson
We report substantial improvements in a compact wide angle neutron spin filter system that was recently employed on the Multi-Axis Crystal Spectrometer at the Center for Neutron Research at the U.S. National Institute of Standards and Technology. The

Frequency-agile, rapid scanning spectroscopy

April 28, 2013
Author(s)
Gar W. Truong, Kevin O. Douglass, Stephen E. Maxwell, Roger D. van Zee, David F. Plusquellic, Joseph T. Hodges, David A. Long
Challenging applications in trace gas analyses require high precision and acquisition rates.1-4 Many continuous-wave laser spectroscopy techniques exhibit significant sensitivity and potential;5 however, their scanning rates are slow because they rely upon

Optical two-way time and frequency transfer over free space

April 28, 2013
Author(s)
Fabrizio R. Giorgetta, William C. Swann, Laura C. Sinclair, Esther Baumann, Ian R. Coddington, Nathan R. Newbury
The transfer of high-quality time-frequency signals between remote locations underpins many applications, including precision navigation and timing, clock-based geodesy, long-baseline interferometry, coherent radar arrays, tests of general relativity and

Individual Ion Addressing with Microwave Field Gradients

April 26, 2013
Author(s)
Ulrich J. Warring, C. Ospelkaus, Yves Colombe, Robert Jordens, Dietrich G. Leibfried, David J. Wineland
Individual-qubit addressing is a prerequisite for many instances of quantum information processing. We present this capability on trapped ions with microwave near-fields delivered by electrode structures integrated into a microfabricated surface-electrode
Displaying 21926 - 21950 of 74229
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