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Displaying 1776 - 1800 of 1916

Mass spectrometry of derivatives and heterocyclic analogues of 9,10-dihydroanthracene

January 1, 1991
Author(s)
Anzor I. Mikaia, Vladimir G. Zaikin, Alexey V. Varlamov, Nikolay A. Prostakov
Fragmentation of derivatives of 9,10-dihydroanthracene and of its heterocyclic analogues containing atoms of O, S, N, P, Si, As, Se and Te at positions 9 and/or 10 is examined. The conditions reviewed are electron impact and chemical ionization in positive

A method for the synthesis of N-alkylpiperidynes.

June 27, 1990
Author(s)
Anzor I. Mikaia, George A. Kliger, OA Lesik, EV Marchevskaya, Vladimir G. Zaikin, Leonid S. Glebov, Sergai Loktev
Reaction gas chromatography–mass spectrometry is applied to establish optimal conditions for the synthesis of N-alkylpiperidynes. Further optimization of the reaction was carried out in a pilot plant.

A method for the synthesis of bi- , tri- and tetracyclic hydrocarbons with five membered rings

January 29, 1990
Author(s)
Anzor I. Mikaia, Anton Shuikin, Leonid S. Glebov, Alexey Yatsenko, Vladimir G. Zaikin, George A. Kliger, Sergai Loktev
Reaction gas chromatography–mass spectrometry is applied to establish optimal conditions for the synthesis of bi- , tri- and tetracyclic hydrocarbons with five membered rings. Further optimization of the reaction was carried out in a pilot plant.

Secondary Ion Yield Matrix Effects in SIMS Depth Profiles of Si/Ge Multilayers

April 1, 1989
Author(s)
John G. Gillen, J M. Phelps, Randall W. Nelson, Peter Williams, Steven M. Hues
Thin multilayer samples of Si/Ge, with individual layer thicknesses of 4-33 nm, have been analyzed by secondary ion mass spectrometry (SIMS) using Ar+, O2+ and Cs+ primary ion beams. Bombardment with both Ar+ and O2+ produced positive secondary ion depth

Microchemical and Molecular Dating

March 1, 1989
Author(s)
Lloyd A. Currie, T. W. Stafford, A. E. Sheffield, George A. Klouda, Stephen A. Wise, Robert A. Fletcher, D. J. Donahue, A.J.T. Jull, T. W. Linick
Displaying 1776 - 1800 of 1916
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