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NIST Authors in Bold

Displaying 15201 - 15225 of 73697

Time in Cyber-Physical Systems

October 2, 2016
Author(s)
Marc A. Weiss, YaShian Li-Baboud, Aviral Shrivastava, Mohammad Khayatian, Patricia Derlery, Hugo A. Andrade, Sundeep Chandhoke, Kevin Stanton, John Eidson
Many modern CPS, especially industrial automation systems, require the actions of multiple computational systems to be synchronized at much higher rates than is possible through ad hoc designs. Fundamental research is needed in synchronizing clocks of

Correlation Between Morphology and Device Performance of pBTTT:PC 71 BM Solar Cells

October 1, 2016
Author(s)
Wenluan Zhang, Hao Shen, Brett W. Guralnick, Brian Kirby, Ngoc A. Nguyen, Roddel Remy, Charles Majkrzak, Michael E. Mackay
Phenyl-C 71-butyric acid methyl ester (PC 71BM) could intercalate between the side-chains of poly(2,5-bis(3-tetradecylthiophen-2-yl)thieno[3,2-b]thiophene (pBTTT) creating a stable co-crystal structure, so optimal solar cell performance was obtained at

From Serendipity to Rational Design: Tuning the Blue Trigonal Bipyramidal Mn 3+ Chromophore to Violet and Purple through Application of Chemical Pressure

October 1, 2016
Author(s)
Jun Li, Simon Lorger, Judith K. Stalick, Arthur W. Sleight, M. A. Subramanian
We recently reported that an allowed d-d transition of trigonal bipyramidal (TBP) Mn 3+ is responsible for the bright blue color in the YIn 10xMn xO 3 solid solution. The crystal field splitting between a'(d z2) and e'(d x2'y2, D xy) energy levels is very

Nanolithography Toolbox:

October 1, 2016
Author(s)
Robert R. Ilic, Krishna Coimbatore Balram, Daron A. Westly, Marcelo I. Davanco, Karen E. Grutter, Qing Li, Thomas Michels, Christopher H. Ray, Liya Yu, Neal A. Bertrand, Samuel M. Stavis, Vladimir A. Aksyuk, James Alexander A. Liddle, Brian A. Bryce, Nicolae Lobontiu, Yuxiang Liu, Meredith Metzler, Gerald Lopez, David Czaplewski, Leonidas Ocola, Pavel Neuzil, Vojtech Svatos, Slava Krylov, Christopher B. Wallin, Ian J. Gilbert, Kristen A. Dill, Richard J. Kasica, Kartik A. Srinivasan, Gregory Simelgor, Juraj Topolancik

Rapid and Accurate C-V Measurements

October 1, 2016
Author(s)
Jihong Kim, Pragya Shrestha, Jason Campbell, Jason Ryan, David M. Nminibapiel, Joseph Kopanski, Kin P. Cheung
We report a new technique for the rapid measurement of full capacitance-voltage (C-V) characteristic curves. The displacement current from a 100 MHz applied sine-wave, which swings from accumulation to strong inversion, is digitized directly using an
Displaying 15201 - 15225 of 73697
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