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Lateral Force Microscope Calibration Using a Modified AFM Cantilever



Mark Reitsma


A proof-of-concept study is presented for a new force transducer and associated calibration method that provides a path for quantitative friction measurements using a Lateral Force Microscope. The transducer design is an Atomic Force Microscope (AFM) cantilever, equipped with lateral lever-arms that facilitate the application of normal and lateral forces, comparable to those acting during a typical AFM friction experiment. The in-situ calibration procedure which can be performed before, during or after a friction experiment produces an optical lever sensitivity for lateral forces. The sensitivity is then used to scale raw friction data to obtain quantitative friction force measurements. A microfabricated version of the prototype would be compatible with typical commercial AFM instrumentation and allow for other common AFM techniques such as imaging and contact force measurements to be performed using the same cantilever.
Review of Science Instruments


calibration, friction, lateral force microscope


Reitsma, M. (2017), Lateral Force Microscope Calibration Using a Modified AFM Cantilever, Review of Science Instruments (Accessed June 20, 2024)


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Created February 19, 2017