Skip to main content
U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Lateral Force Microscope Calibration Using a Modified AFM Cantilever

Published

Author(s)

Mark Reitsma

Abstract

A proof-of-concept study is presented for a new force transducer and associated calibration method that provides a path for quantitative friction measurements using a Lateral Force Microscope. The transducer design is an Atomic Force Microscope (AFM) cantilever, equipped with lateral lever-arms that facilitate the application of normal and lateral forces, comparable to those acting during a typical AFM friction experiment. The in-situ calibration procedure which can be performed before, during or after a friction experiment produces an optical lever sensitivity for lateral forces. The sensitivity is then used to scale raw friction data to obtain quantitative friction force measurements. A microfabricated version of the prototype would be compatible with typical commercial AFM instrumentation and allow for other common AFM techniques such as imaging and contact force measurements to be performed using the same cantilever.
Citation
Review of Science Instruments

Keywords

calibration, friction, lateral force microscope

Citation

Reitsma, M. (2017), Lateral Force Microscope Calibration Using a Modified AFM Cantilever, Review of Science Instruments (Accessed June 20, 2024)

Issues

If you have any questions about this publication or are having problems accessing it, please contact reflib@nist.gov.

Created February 19, 2017