U.S. flag

An official website of the United States government

Official websites use .gov
A .gov website belongs to an official government organization in the United States.

Secure .gov websites use HTTPS
A lock ( ) or https:// means you’ve safely connected to the .gov website. Share sensitive information only on official, secure websites.

Search Publications

NIST Authors in Bold

Displaying 1226 - 1250 of 5218

Engineered metal nanoparticles in the sub-nanomolar levels kill cancer cells

April 18, 2016
Author(s)
Yasmine C. Daniels, William A. MacCrehan, Shinichiro Muramoto, Gheorghe NMN Stan, Vitaly Vodyanoy, Oleg Pustovyy
Zinc and copper metal nanoparticles were produced from bulk metal rods by an underwater high-voltage discharge method. The metal nanoparticles, with estimated diameters of 1 nm to 2 nm, were determined to be more than 85 % non-oxidized. Exposure of rat RG2

Towards Establishing Compact Imaging Spectrometer Standards

March 31, 2016
Author(s)
David W. Allen, Elmer T. Slonecker, Ronald G. Resmini
Remote sensing science is currently undergoing a tremendous expansion in the area of hyperspectral imaging (HSI) technology. Spurred largely by the explosive growth of Unmanned Aerial Vehicles (UAV), sometimes called Unmanned Aircraft Systems (UAS), or

Virtual rough samples to test 3D nanometer-scale SEM stereo photogrammetry

March 22, 2016
Author(s)
John S. Villarrubia, Vipin N. Tondare, Andras Vladar
The combination of SEM for high spatial resolution, images from multiple angles to provide 3D information, and commercially available stereo photogrammetry software for 3D reconstruction offers promise for dimensional metrology in 3D. A method is described

Centroid and Orientation Precision of Localization Microscopy

March 11, 2016
Author(s)
Craig D. McGray, Craig R. Copeland, Samuel M. Stavis, Jon C. Geist
The concept of localization precision, which is essential to localization microscopy, is formally extended from optical point sources to microscopic rigid bodies. Measurement functions are presented to calculate the planar position, orientation, and motion

A Review and Survey of Metrology Outreach Efforts in Post-Secondary Education

March 1, 2016
Author(s)
Georgia L. Harris, Maria Isabel Pena
The paper presents a brief history and background of metrology outreach efforts to colleges and universities. It also includes a summary of a 2015 international educational survey used in part to assess colleges and universities that have measurement

Low-Ohmic Resistance Comparison: Measurement Capabilities and Resistor Traveling Behavior

March 1, 2016
Author(s)
Marlin E. Kraft, Randolph E. Elmquist, Gert Rietveld, Jan van der Beek, Alessandro Mortara, Beat Jeckelmann
The low-ohmic resistance measurement capabilities of the Van Swinden Laboratorium, National Institute of Standards and Technology, and the Federal Office of Metrology (METAS) were compared using a set of resistors with values 100 mΩ, 10 mΩ, 1 mΩ, and 100
Displaying 1226 - 1250 of 5218
Was this page helpful?