February 4, 2025
Author(s)
Mathieu Walsh, Philippe Guay, J.D. Deschenes, Nathan Malarich, Ian Coddington, Kevin Cossel, Jerome Genest
With suficiently high signal-to-noise, several systematic errors become prominent in dual-comb interferometry measurements. This paper reviews several error sources including electrical, photo-detection, amplification and acquisition chain nonlinearity