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Displaying 8226 - 8250 of 73727

Leveraging standard geospatial representations for industrial augmented reality

May 1, 2020
Author(s)
Teodor I. Vernica, Aaron M. Hanke, William Z. Bernstein
Due to its tremendous potential, Augmented Reality (AR) has experienced a recent surge in adoption and integration within the manufacturing enterprise. While industrial AR has been successfully implemented and shown to have significant benefits in a

Low-loss, high-bandwidth fiber-to-chip coupling using capped adiabatic tapered fibers

May 1, 2020
Author(s)
Saeed Khan, Jeff Shainline, Richard Mirin, Sae Woo Nam, Sonia Buckley, Jeff Chiles
We demonstrate adiabatically tapered fibers terminating in sub-micron tips that are clad with a higher-index material for coupling to an on-chip waveguide. This cladding enables coupling to a high-index waveguide without losing light to the buried oxide. A

Basic Metrology for 2020

April 30, 2020
Author(s)
Stephan Schlamminger, Richard Davis
2019 was a big year for Metrology. The international system of units was revised on World Metrology Day, May 20th, that year [1]. What will 2020 bring? In this article we discuss five promising advances that we have on a watchlist for 2020. First, we

Proceedings of the 11th Model-Based Enterprise Summit (MBE 2020)

April 30, 2020
Author(s)
Thomas D. Hedberg Jr., Mark G. Carlisle
The National Institute of Standards and Technology (NIST) hosted the eleventh installment of the Model-Based Enterprise Summit (MBE 2020) on March 31 through April 2, 2020 in Gaithersburg, Maryland. The MBE 2020 witnessed another year-over-year
Displaying 8226 - 8250 of 73727
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