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Displaying 801 - 825 of 912

Influence of Tip Wear on Atomic Force Acoustic Microscopy Experiments

January 31, 2005
Author(s)
Malgorzata Kopycinska-Mueller, Roy H. Geiss, Paul Rice, Donna C. Hurley
Tip wear and its corresponding change in geometry is a major impediment for quantifying atomic force acoustic microscopy (AFAM). To better understand the process of tip wear and its influence on AFAM measurements of material elastic properties, we have

Polycyclic Aromatic Hydrocarbons in Flames, in Diesel Fuels, and in Diesel Emissions

January 1, 2005
Author(s)
Robert A. Fletcher, R Dobbins, Bruce A. Benner Jr, S Hoeft
Diesel fuels and emissions are composed of numerous hydrocarbon species. Combustion generated or pyrogenic polycyclic aromatic hydrocarbons (PAHs) derived from premixed and diffusion flames often consists of the most stable benzenoid PAHs. In contrast

Nanoscale Elastic-Property Mapping with Contact-Resonance-Frequency AFM

December 31, 2004
Author(s)
Donna C. Hurley, Tony B. Kos, Paul Rice
We describe dynamic atomic force microscopy (AFM) techniques to map the nanoscale elastic properties of surfaces, thin films, and nanostructures. Our approach is based on atomic force acoustic microscopy (AFAM) methods that have previously been used for

Standardization of Isotope Ratio Measurements for Doping Control

December 1, 2004
Author(s)
R M. Verkouteren
Pharmaceutical steroids are known to differ in isotopic composition from those produced naturally in the body. By measuring the 13 C/ 12C ratio of specific steroids deteched in urine, the technique of Gas Chromatography-Combustion-Isotope Ratio Mass

Dynamic behavior of dagger-shaped atomic force microscope cantilevers

October 20, 2004
Author(s)
K Shen, Donna C. Hurley, J Turner
Experimental techniques based on the atomic force microscope (AFM) have been developed for characterizing mechanical properties at the nanoscale and applied to a variety of materials and structures. Atomic force acoustic microscopy (AFAM) is one such

Automated Analysis of Organic Particles Using Cluster SIMS

June 1, 2004
Author(s)
John G. Gillen, Cynthia J. Zeissler, Christine M. Mahoney, Abigail P. Lindstrom, Robert A. Fletcher, P Chi, Jennifer R. Verkouteren, David S. Bright, R Lareau, M Boldman
Cluster primary ion bombardment combined with secondary ion imaging is used in an ion microscope secondary ion mass spectrometer for the spatially resolved analysis of organic particles on various surfaces. Compared to the use of monoatomic primary ion

Semiconductor Nanocrystal Probes for Human Metaphase Chromosomes

February 1, 2004
Author(s)
Yan Xiao, Peter E. Barker
Novel inorganic fluorophores called semiconductor nanocrystals have recently been incorporated into protein, antibody and microbead oligonucleotide detection methods where previously, organic dyes were universally employed. To improve quantitation of

Nanometrology - FY 2003 Program and Selected Accomplishments

December 15, 2003
Author(s)
Clare M. Allocca, Stephen W. Freiman
The emphasis on nanotechnology around the world is leading to the development and commercialization of unique products based upon significantly smaller devices and material ensembles. Materials at the nanoscale in three dimensions (NEMS, MEMS), two

Isotopic Metrology of Carbon Dioxide. I. Interlaboratory Comparison and Empirical Modeling of Inlet Equilibration Time, Inlet Pressure, and Ion Source Conductance

June 1, 2003
Author(s)
R M. Verkouteren, C E. Allison, S A. Studley, K J. Leckrone
We report a pilot study of high-precision differential isotopic ratio measurements made on replicate samples of pure carbon dioxide using three instruments of identical manufacture. Measurement protocols were designed to explore the effects of sample size

Virtual Environment for Manipulating Microscopic Particles with Optical Tweezer

June 1, 2003
Author(s)
Yong-Gu Lee, Kevin W. Lyons, Thomas W. LeBrun
In this paper, we use virtual reality techniques to define an intuitive interface to a nanoscale manipulation device. This device utilizes optical methods to focus laser light to trap and reposition nano-to-microscopic particles. The underlying physics are

Physics Laboratory: 2002 Activities, Accomplishments and Recognition

February 1, 2003
Author(s)
Jonathan E. Hardis, William R. Ott, G G. Wiersma
This report summarizes the research and measurement science carried out during calendar year 2001 in the NIST Physics Laboratory. The Laboratory supports U.S. industry, government, and the scientific community by providing measurement services and research

Diffusion Barrier Cladding in Si/SiGe Resonant Interband Tunneling Diodes and Their Patterned Growth on PMOS Source/Drain Regions

January 1, 2003
Author(s)
N Jin, A T. Rice, P R. Berger, P E. Thompson, C Rivas, R Lake, S Sudirgo, J J. Kempisty, B Curanovic, S L. Rommel, K D. Hirschman, S K. Kurinec, P Chi, David S. Simons, S.J. Chung
Si/SiGe resonant interband tunnel diodes (RITD) employing delta-doping spikes that demonstrate negative differential resistance (NDR) at room temperature are presented. Efforts have focused on improving the tunnel diode peak-to-valley current ratio (PVCR)

Secondary Ion Mass Spectrometry Using Cluster Primary Ion Beams

January 1, 2003
Author(s)
John G. Gillen, Albert J. Fahey
At the National Institute of Standards and Technology (NIST) we have a capability for conducting cluster SIMS experiments on both our ion microscope and TOF-SIMS instruments. This paper will review our recent work on cluster ion source development
Displaying 801 - 825 of 912
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